参数资料
型号: MAC7111MPV50
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 50 MHz, MICROCONTROLLER, PQFP144
封装: LQFP-144
文件页数: 29/60页
文件大小: 760K
代理商: MAC7111MPV50
ElectricalCharacteristics
MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.1.1
Preliminary
Freescale Semiconductor
35
3.13.8 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase
cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
NOTE
All values shown in Table 36 are target values and subject to
characterization. For Flash cycling performance, each program operation
must be preceded by an erase.
Table 36. NVM Reliability Characteristics
Conditions shown in Table 7 unless otherwise noted.
Num
C
Rating
Min
Unit
X11
C Program/Data Flash Program/Erase endurance (–40C to +125C)
10,000
Cycles
X12
C Program/Data Flash Data Retention Lifetime
15
Years
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