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参数资料
| 型号： | MAX1125BIDO |
| 厂商： | MAXIM INTEGRATED PRODUCTS INC |
| 元件分类： | ADC |
| 英文描述： | 8-Bit, 300Msps Flash ADC |
| 中文描述： | 1-CH 8-BIT FLASH METHOD ADC, PARALLEL ACCESS, CDIP42 |
| 封装： | SIDEBRAZED, CERAMIC, DIP-42 |
| 文件页数： | 3/12页 |
| 文件大小： | 114K |
| 代理商： | MAX1125BIDO |
M
8-Bit, 300Msps Flash ADC
_______________________________________________________________________________________
3
ELECTRICAL CHARACTERISTICS (continued)
(V
EE
= -5.2V, R
SOURCE
= 50
, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, f
CLK
= 150MHz, 50% Duty Cycle, T
A
= T
MIN
to T
MAX
,
unless otherwise noted.)
I
VI
VI
VI
VI
VI
I
V
VI
VI
VI
VI
VI
VI
VI
V
TEST
LEVEL
W
2.2
2.9
T
A
= +25 °C
Power Dissipation
mA
425
550
T
A
= +25 °C
Supply Current
ns
2.4
V
-1.5
50
to -2V
Digital Output Low Voltage
POWER-SUPPLY REQUIREMENTS
V
-1.1
50
to -2V
Digital Output High Voltage
ns
2
1.8
Clock High Width, T
PWH
DIGITAL OUTPUTS
ns
2
1.8
Clock Low Width, T
PWL
μA
40
Clock Synchronous
Input Currents
39
-48
-40
44
37
42
-52
-43
46
39
dB
45
47
F
IN
= 3.58MHz
F
IN
= 100MHz
Signal-to-Noise Ratio
V
-2.0
-1.5
Digital Input High Voltage
(MINV, LINV)
V
-1.1
-0.7
dB
F
IN
= 3.58MHz
F
IN
= 100MHz
F
IN
= 3.58MHz
F
IN
= 100MHz
Total Harmonic Distortion
dB
Signal-to-Noise and
Distortion (SINAD)
UNITS
MAX1114A
TYP
MIN
MAX
CONDITIONS
PARAMETER
2.2
2.9
425
550
2.4
-1.5
-1.1
2
1.8
2
1.8
40
38
-46
-39
42
35
41
-50
-42
44
37
44
46
-2.0
-1.5
-1.1
-0.7
MAX1114B
TYP
MIN
MAX
Digital Input Low Voltage
(MINV, LINV)
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications are
guaranteed. The Test Level column indicates the
specific device testing actually performed during
production and Quality Assurance inspection.
Any blank section in the data column indicates
that the specification is not tested at the specified
condition.
Unless otherwise noted, all tests are pulsed;
therefore, T
j
= T
C
= T
A
.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25°C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25°C. Parameter is guaranteed
over specified temperature range.
DIGITAL INPUTS
DYNAMIC PERFORMANCE
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