参数资料
型号: MAX1160ACWI
厂商: MAXIM INTEGRATED PRODUCTS INC
元件分类: ADC
英文描述: 10-Bit, 20Msps, TTL-Output ADC
中文描述: 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO28
封装: 0.300 INCH, PLASTIC, MS-013AE, SOIC-28
文件页数: 4/8页
文件大小: 76K
代理商: MAX1160ACWI
M
10-Bit, 20Msps, T T L-Output ADC
4
_______________________________________________________________________________________
ELECTRICAL CHARACTERISTICS (continued)
(V
CC
= +5.0V, V
EE
= -5.2V, DV
CC
= +5.0V, V
IN
= ±2.0V, VSB = -2.0V, VST = +2.0V, f
CLK
= 20MHz, 50% clock duty cycle,
T
A
= T
MIN
to T
MAX
, unless otherwise noted.)
V
V
V
V
2.4
4.5
0.8
Logic 1 Voltage
Logic 0 Voltage
2.4
4.0
0.8
IV
μA
0
5
20
T
A
= +25°C
Maximum Input
Current Low
0
5
20
Pulse Width High (CLK)
DIGITAL OUTPUTS
ns
20
300
IV
20
300
Maximum Input
Current High
Pulse Width Low (CLK)
μA
ns
20
IV
20
IV
0
5
20
0
5
20
T
A
= +25°C
TEST
LEVEL
UNITS
MAX1160A
MIN
TYP
MAX
CONDITIONS
PARAMETER
MAX1160B
MIN
TYP
MAX
Logic 1 Voltage
Logic 0 Voltage
POWER-SUPPLY REQUIREMENTS
V
V
2.4
IV
IV
2.4
0.6
0.6
4.75
-4.95
5.0
-5.2
118
5.25
-5.45
145
IV
IV
VI
4.75
-4.95
5.0
-5.2
118
5.25
-5.45
145
DV
CC
-V
EE
I
CC
4.75
5.25
IV
4.75
5.25
V
CC
Power Dissipation
Power-Supply Rejection
1.0
1.0
1.3
VI
V
1.0
1.0
1.3
V
V
CC
= 5V ±0.25V, V
EE
= -5.2V ±0.25V
LSB
W
40
40
55
57
VI
VI
40
40
55
57
DI
CC
-I
EE
mA
DIGITAL INPUTS
Currents
Voltages
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The
Test Level column indicates the specific device testing actually per-
formed during production and Quality Assurance inspection. Any
blank section in the data column indicates that the specification is
not tested at the specified condition.
Unless otherwise noted, all tests are pulsed; therefore,
Tj= TC= TA.
______________________________________________________________Pin Desc ription
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25°C, and sample tested at the specified
temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25°C. Parameter is guaranteed over specified
temperature range.
NAME
DGND
D0
D1–D8
D9
1, 13
2
3–10
11
PIN
12
D10
DV
CC
15
CLK
V
EE
FUNCTION
16, 27
Digital Ground
TTL Output (LSB)
TTL Outputs
TTL Output (MSB)
TTL Output Overrange
14, 28
+5V Supply (digital)
Clock
-5.2V Supply (analog)
NAME
AGND
20
21
22
23
24
VST
VIN
VRM
VSB
VFB
19
PIN
17, 26
VFT
18, 25
V
CC
FUNCTION
Sense for Top of Reference Ladder
Analog Input
Middle of Voltage Reference Ladder
Sense for Bottom of Reference Ladder
Force for Bottom of Reference Ladder
Force for Top of Reference Ladder
+5V Supply (analog)
Analog Ground
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