参数资料
型号: MAX1170CBH
厂商: MAXIM INTEGRATED PRODUCTS INC
元件分类: ADC
英文描述: 12-Bit, 10Msps, TTL-Output ADC
中文描述: 1-CH 12-BIT FLASH/SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CQFP44
封装: MO-047AC, CERQUAD-44
文件页数: 4/12页
文件大小: 83K
代理商: MAX1170CBH
ELECTRICAL CHARACTERISTICS (continued)
(V
CC
= +5.0V, V
EE
= -5.2V, DV
CC
= +5.0V, V
IN
= ±2.0V, V
SB
= -2.0V, V
ST
= +2.0V, f
CLK
= 10MHz, 50% clock duty cycle,
T
A
= T
MIN
to T
MAX
, unless otherwise noted.)
M
12-Bit, 10Msps, T T L-Output ADC
4
_______________________________________________________________________________________
Note 1:
Typical thermal impedances (unsoldered, in free air):
32 Ceramic SB:
θ
j
A
= 50°C/W
44 CERQUAD:
θ
j
A
= 78°C/W,
θ
j
A
at 1m/s airflow = 58°C/W,
θ
j
C
= 3.3°C/W
Use forced-air cooling or heatsinking to maintain T
j
150°C.
TEST
LEVEL
IV
IV
IV
I
4.75
4.75
-4.95
5.0
5.0
-5.2
135
40
45
5.25
5.25
-5.45
150
55
70
UNITS
PARAMETER
DV
CC
-V
EE
I
CC,
T
A
= +25°C
V
CC
MIN
TYP
MAX
Voltages
CONDITIONS
V
Power Dissipation
Power-Supply Rejection
VI
V
1.1
1.0
1.3
W
5V ±0.25V, -5.2V ±0.25V
LSB
DI
CC,
T
A
= T
MIN
to T
MAX
-I
EE,
T
A
= +25°C
IV
I
Currents
mA
POWER-SUPPLY REQUIREMENTS
100% production tested at T
A
= +25°C. Parameter is guaranteed
over specified temperature range.
VI
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality
Assurance inspection. Any blank section in the
data column indicates that the specification is
not tested at the specified condition.
Unless otherwise noted, all tests are pulsed;
therefore, T
j
= T
C
= T
A
.
Parameter is a typical value for information purposes only.
V
Parameter is guaranteed (but not tested) by design and charac-
terization data.
IV
QA sample tested only at the specified temperatures.
III
100% production tested at T
A
= +25°C, and sample tested at the
specified temperatures.
II
100% production tested at the specified temperature.
I
TEST PROCEDURE
TEST LEVEL
TEST LEVEL CODES
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