参数资料
型号: MAX8895XEWA+T
厂商: Maxim Integrated Products
文件页数: 4/5页
文件大小: 0K
描述: IC LI-ION CHARGER LOW SPD 25WLP
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 1
功能: 充电管理
电池化学: 锂离子(Li-Ion)
电源电压: 4 V ~ 6.6 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 25-WFBGA,WLCSP
供应商设备封装: 25-WLP(2.09x2.09)
包装: 标准包装
其它名称: MAX8895XEWA+TDKR
MAX8895
V. Quality Assurance Information
A. Quality Assurance Contacts:
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate:
D. Sampling Plan:
Richard Aburano (Manager, Reliability Operations)
Bryan Preeshl (Vice President of QA)
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
< 50 ppm
Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as follows:
=
1
MTTF
=
1.83 (Chi square value for MTTF upper limit)
192 x 4340 x 48 x 2
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
= 22.9 x 10
-9
= 22.9 F.I.T. (60% confidence level @ 25°C)
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly life test
monitors on its processes. This data is published in the Reliability Report found at http://www.maxim-ic.com/qa/reliability/monitor.
Cumulative monitor data for the S18 Process results in a FIT Rate of 0.40 @ 25C and 6.96 @ 55C (0.8 eV, 60% UCL)
B. E.S.D. and Latch-Up Testing (lot SB4ZAQ002C, D/C 1003)
The PR39 die type has been found to have all pins able to withstand a transient pulse of
ESD-HBM:
ESD-CDM:
+/- 2500V per JEDEC JESD22-A114
+/- 750V per JEDEC JESD22-C101
Latch-Up testing has shown that this device withstands a current of +/- 250mA and overvoltage per JEDEC JESD78.
Maxim Integrated Products. All rights reserved.
Page 4
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