参数资料
型号: MC100E212FN
厂商: ON SEMICONDUCTOR
元件分类: 锁存器
英文描述: 100E SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, PQCC28
封装: PLASTIC, LCC-28
文件页数: 5/7页
文件大小: 183K
代理商: MC100E212FN
MC10E212, MC100E212
http://onsemi.com
5
2. Within-gate skew is defined as the difference in delays between various outputs of a gate when driven from the same input.
Figure 1. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020 Termination of ECL Logic Devices.)
W
Driver
Device
Receiver
Device
QD
50
W
50
V TT
Q
D
VTT = VCC 2.0 V
Resource Reference of Application Notes
AN1404
ECLinPS Circuit Performance at NonStandard VIH Levels
AN1405
ECL Clock Distribution Techniques
AN1406
Designing with PECL (ECL at +5.0 V)
AN1503
ECLinPS I/O SPICE Modeling Kit
AN1504
Metastability and the ECLinPS Family
AN1568
Interfacing Between LVDS and ECL
AN1596
ECLinPS Lite Translator ELT Family SPICE I/O Model Kit
AN1650
Using WireOR Ties in ECLinPS Designs
AN1672
The ECL Translator Guide
AND8001
Odd Number Counters Design
AND8002
Marking and Date Codes
AND8020
Termination of ECL Logic Devices
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