参数资料
型号: MC10162P
厂商: ON SEMICONDUCTOR
元件分类: 编、解码器及复用、解复用
英文描述: 10K SERIES, OTHER DECODER/DRIVER, INVERTED OUTPUT, PDIP16
封装: PLASTIC, DIP-16
文件页数: 2/4页
文件大小: 87K
代理商: MC10162P
MC10162
http://onsemi.com
2
ELECTRICAL CHARACTERISTICS
Test Limits
Pin
Under
–30
°C
+25
°C
+85
°C
Characteristic
Symbol
Under
Test
Min
Max
Min
Typ
Max
Min
Max
Unit
Power Supply Drain Current
IE
8
84
61
76
84
mAdc
Input Current
IinH
14
350
220
Adc
IinL
14
0.5
0.3
Adc
Output Voltage
Logic 1
VOH
13
–1.060
–0.890
–0.960
–0.810
–0.890
–0.700
Vdc
Output Voltage
Logic 0
VOL
13
–1.890
–1.675
–1.850
–1.650
–1.825
–1.615
Vdc
Threshold Voltage
Logic 1
VOHA
13
–1.080
–0.980
–0.910
Vdc
Threshold Voltage
Logic 0
VOLA
13
–1.655
–1.630
–1.595
Vdc
Switching Times (50
Load)
ns
Propagation Delay
t14+13–
t14–13+
13
1.5
6.2
1.5
4.0
6.0
1.5
6.4
Rise Time
(20 to 80%)
t13+
13
1.0
3.3
1.1
2.0
3.3
1.1
3.5
Fall Time
(20 to 80%)
t13–
13
1.0
3.3
1.1
2.0
3.3
1.1
3.5
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30
°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25
°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85
°C
–0.700
–1.825
–1.035
–1.440
–5.2
Pin
Under
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
(V
)
Characteristic
Symbol
Under
Test
VIHmax
VILmin
VIHAmin
VILAmax
VEE
(VCC)
Gnd
Power Supply Drain Current
IE
8
1,16
Input Current
IinH
14
8
1,16
IinL
14
8
1,16
Output Voltage
Logic 1
VOH
13
14
8
1,16
Output Voltage
Logic 0
VOL
13
2
15
8
1,16
Threshold Voltage
Logic 1
VOHA
13
14
8
1,16
Threshold Voltage
Logic 0
VOLA
13
2
15
8
1,16
Switching Times
(50
Load)
Pulse In
Pulse Out
–3.2 V
+2.0 V
Propagation Delay
t14+13+
t14–13–
13
14
13
8
1,16
Rise Time
(20 to 80%)
t+
13
14
13
8
1,16
Fall Time
(20 to 80%)
t–
13
14
13
8
1,16
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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