参数资料
型号: MC10H016FNG
厂商: ON Semiconductor
文件页数: 3/7页
文件大小: 0K
描述: IC COUNTER 4BIT BINARY 20PLCC
产品变化通告: Dimensional change 21/Oct/2008
Product Discontinuation 21/Jun/2007
标准包装: 46
系列: 10H
逻辑类型: 二进制计数器
方向:
元件数: 1
每个元件的位元数: 4
复位: 异步
计时: 同步
计数速率: 200MHz
触发器类型: 正边沿
工作温度: 0°C ~ 75°C
安装类型: 表面贴装
封装/外壳: 20-LCC(J 形引线)
供应商设备封装: 20-PLCC(9x9)
包装: 管件
其它名称: MC10H016FNGOS
MC10H016
http://onsemi.com
3
Table 3. ELECTRICAL CHARACTERISTICS (VEE = 5.2 V ±5%) (Note 1)
0°
25°
75°
Symbol
Characteristic
Min
Max
Min
Max
Min
Max
Unit
IE
Power Supply Current
126
115
126
mA
IinH
Input Current High
All Except MR
Pin 12 MR
450
1190
265
700
265
700
mA
IinL
Input Current Low
0.5
0.5
0.3
mA
VOH
High Output Voltage
1.02
0.84
0.98
0.81
0.92
0.735
Vdc
VOL
Low Output Voltage
1.95
1.63
1.95
1.63
1.95
1.60
Vdc
VIH
High Input Voltage
1.17
0.84
1.13
0.81
1.07
0.735
Vdc
VIL
Low Input Voltage
1.95
1.48
1.95
1.48
1.95
1.45
Vdc
1. Each MECL 10H series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 Ifpm is maintained.
Outputs are terminated through a 50 W resistor to 2.0 V.
Table 4. AC CHARACTERISTICS
0°
25°
75°
Symbol
Characteristic
Min
Max
Min
Max
Min
Max
Unit
tpd
Propagation Delay
Clock to Q
Clock to TC
MR to Q
1.0
0.7
2.4
1.0
0.7
2.5
1.0
0.7
2.7
2.6
ns
tset
Setup Time
Pn to Clock
CE or PE to Clock
2.0
2.5
2.0
2.5
2.0
2.5
ns
thold
Hold Time
Clock to Pn
Clock to CE or PE
1.0
0.5
1.0
0.5
1.0
0.5
ns
fcount
Counting Frequency
200
200
200
MHz
tr
Rise Time
0.5
2.0
0.5
2.1
0.5
2.2
ns
tf
Fall Time
0.5
2.0
0.5
2.1
0.5
2.2
ns
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
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