参数资料
型号: MC33340DG
厂商: ON Semiconductor
文件页数: 9/16页
文件大小: 0K
描述: IC CTLR BATTERY FAST CHRG 8SOIC
产品变化通告: Product Obsolescence 14/Apr/2010
标准包装: 98
功能: 充电管理
电池化学: 镍镉(NiCd)、镍金属氢化物(NiMH)
电源电压: 3.25 V ~ 18 V
工作温度: -25°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOICN
包装: 管件
其它名称: MC33340DGOS
MC33340, MC33342
Table 2. CONTROLLER OPERATING MODE TABLE
Input Condition
V sen Input Voltage:
>1.0 V and <2.0 V
>1.0 V and <2.0 V with
two consecutive ? D V
events detected after the
initial holdoff period (thold)
<1.0 V or >2.0 V
Timer Backup:
Within time limit
Beyond time limit
Temperature Backup:
Within limits
Below lower limit
Above upper limit
Power Supply Voltage:
V CC >3.0 V and <18 V
V CC >0.6 V and <2.8 V
Controller Operation
The divided down battery pack voltage is within the fast charge voltage range. The charger switches
from trickle to fast charge mode as V sen enters this voltage range, and a reset pulse is then applied to
the timer and the overtemperature latch.
The battery pack has reached full charge and the charger switches from fast to a latched trickle mode.
A reset pulse must be applied for the charger to switch back to the fast mode. The reset pulse occurs
when entering the 1.0 V to 2.0 V window for V sen or when V CC rises above 3.0 V.
The divided down battery pack voltage is outside of the fast charge voltage range. The charger
switches from fast to trickle mode.
The timer has not exceeded the programmed limit. The charger will be in fast charge mode if V sen and
V CC are within their respective operating limits.
The timer has exceeded the programmed limit. The charger switches from fast to a latched
trickle mode.
The battery pack temperature is within the programmed limits. The charger will be in fast charge mode
if V sen and V CC are within their respective operating limits.
The battery pack temperature is below the programmed lower limit. The charger will stay in trickle
mode until the lower temperature limit is exceeded. When exceeded, the charger will switch from trickle
to fast charge mode.
The battery pack temperature has exceeded the programmed upper limit. The charger switches from
fast to a latched trickle mode. A reset signal must be applied and then released for the charger to
switch back to the fast charge mode. The reset pulse occurs when entering the 1.0 V to 2.0 V window
for V sen or when V CC rises above 3.0 V.
This is the nominal power supply operating voltage range. The charger will be in fast charge mode if
V sen , and temperature backup or timer backup are within their respective operating limits.
The undervoltage lockout comparator will be activated and the charger will be in trickle mode. A reset
signal is applied to the timer and over temperature latch.
Testing
Under normal operating conditions, it would take
283 minutes to verify the operation of the 34 stage ripple
counter used in the timer. In order to significantly reduce the
test time, three digital switches were added to the circuitry
and are used to bypass selected divider stages. Entering each
of the test modes without requiring additional package pins
or affecting normal device operation proved to be
challenging. Refer to the timer functional block diagram in
Figure 11.
Switch 1 bypasses 19 divider stages to provide a 524,288
times speedup of the clock. This switch is enabled when the
V sen input falls below 1.0 V. Verification of the programmed
fast charge time limit is accomplished by measuring the
propagation delay from when the V sen input falls below
1.0 V, to when the F/T output changes from a high?to?low
state. The 71, 106, 141, 177, 212, 247 and 283 will now
correspond to 8.1, 12.1, 16.2, 20.2, 24.3, 28.3 and 32.3 ms
delays. It is possible to enter this test mode during operation
if the equivalent battery pack voltage was to fall below 1.0 V.
This will not present a problem since the device would
conditions, and the relatively short variable time delay
would be transparent to the user.
Switch 2 bypasses 11 divider stages to provide a 2048
times speedup of the clock. This switch is necessary for
testing the 19 stages that were bypassed when switch 1 was
enabled. Switch 2 is enabled when the V sen input falls below
1.0 V and the t1/T ref High input is biased at ?100 mV.
Verification of the 19 stages is accomplished by measuring
a nominal propagation delay of 338.8 ms from when the V sen
input falls below 1.0 V, to when the F/T output changes from
a high?to?low state.
Switch 3 is a dual switch consisting of sections “A” and
“B”. Section “A” bypasses 5 divider stages to provide a 32
times speedup of the V sen gate signal that is used in sampling
the battery voltage. This speedup allows faster test
verification of two successive ? D V events. Section “B”
bypasses 11 divider stages to provide a 2048 speedup of the
trickle mode holdoff timer. Switches 3A and 3B are both
activated when the t1/T ref High input is biased at ?100 mV
with respect to Pin 4.
normally switch from fast to trickle mode under these
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