参数资料
型号: MC33385VW
厂商: Freescale Semiconductor
文件页数: 14/18页
文件大小: 0K
描述: IC SWITCH QUAD L-SIDE 20-HSOP
标准包装: 30
类型: 低端
输入类型: 串行
输出数: 4
导通状态电阻: 250 毫欧
电流 - 输出 / 通道: 2.5A
电流 - 峰值输出: 3A
电源电压: 4.5 V ~ 5.5 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 20-SOIC(0.433",11.00mm 宽)裸露焊盘
供应商设备封装: 20-HSOP
包装: 管件
FUNCTIONAL DESCRIPTION
INTRODUCTION
FUNCTIONAL DESCRIPTION
INTRODUCTION
The device is a Quad Low-side Driver driven by four
CMOS input stages. Each output power transistor is
protected against short to V BAT by a zener clamp against
overvoltage.
A diagnostic logic recognizes four failure types at the
output stage : overcurrent, short to GND, open-load and
overtemperature.
The failures are individually stored in a byte which can be
read out via the serial interface (SPI).
OUTPUT STAGE CONTROL
Each of the four output stages is switched ON and OFF by
an individual control line (NON-Input). The logic level of the
control line is CMOS compatible. The output transistors are
switched off when the inputs are not connected.
POWER TRANSISTORS
Each of the four output stages has its own zener clamp.
This causes a voltage limitation at the power transistors when
inductive loads are switched off. The drain voltage ramp
occurring when output is switched on or off, is within defined
limits. Output transistors can be connected in parallel to
increase current capability. In this case, the associated inputs
should be connected together.
SHORT-CIRCUIT AND OVERTEMPERATURE
PROTECTION
If the output current increases above the short current limit
for a time longer than t SCB or if the temperature increases
above T OFF then the power transistor is immediately
switched off. It remains switched off until the control signal on
the NON-Input is switched off and on again.
DIAGNOSTICS
The following failures at the output stage are recognized :
Short -Circuit to V BAT or overtemp = SCB (Highest priority)
Short -Circuit to GND.................... = SCG
Open Load...................................... = OL (Lowest priority)
The SCB failure is recognized by an overcurrent (current
above the short current limit) or an overtemperature.
If the current through the output stage is lower than the
IOL-reference, after a filter time an OL failure will be
recognized. This measurement is active while the power
stage is switched on.
The SCG failure will recognize when the drain voltage is
lower than the OL reference limit, while the output stage is
switched off. All four outputs have an independent
overtemperature detection and shutdown. All failures are
stored in individual registers.
They can be read by the microprocessor via the serial
interface. There is no failure detected if the power stage
control time is shorter than the filter time.
DIAGNOSTIC INTERFACE
The communication between the microprocessor and the
failure register runs via the SPI link. If there is a failure stored
in the failure register, the first bit of the shift register is set to
a high level. With the High/Low change on the NCS pin, the
first bit of the diagnostic shift register will be transmitted to the
SDO output. The SDO output is the serial output from the
diagnostic shift register and it is put into a tri-state when the
NCS pin is high. The CLK pin clocks the diagnostic shift
register. New SDO data will appear on every rising edge of
this pin and new SDI data will be latched on every CLK’s
falling edge into the shift register. With the first positive pulse
of the CLK, the failure register will be cleared. There is no bus
collision at a small spike at the NCS. The CLK is always LOW
while the NCS-signal is changing.
RESET
There are two different reset functions realized :
Under voltage reset : as long as the V CC voltage is lower
than V CCRES , the power stages are switched off and the
failure-registers are reset.
Reset pin : as long as the NRES-pin is low, following
circuits are reset :
? Power stages
? Failure register
UNDERVOLTAGE PROTECTION
At low V CC voltage, the device remains switched off even
if there is a voltage ramp at the OUT pin.
33385
Analog Integrated Circuit Device Data
14
Freescale Semiconductor
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