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| 型号： | MC34848EP |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 5/38页 |
| 文件大小： | 0K |
| 描述： | IC LED DVR BACKLIGHT 8CH 48QFN |
| 产品变化通告： | AMPD Product Discontinuation 12/Dec/2012 |
| 标准包装： | 260 |
| 恒定电流： | 是 |
| 恒定电压： | 是 |
| 拓扑： | PWM，升压（升压） |
| 输出数： | 8 |
| 内部驱动器： | 是 |
| 类型 - 主要： | 背光 |
| 频率： | 200kHz ~ 1.2MHz |
| 电源电压： | 2.6 V ~ 3.6 V |
| 输出电压： | 45V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 48-VFQFN 裸露焊盘 |
| 供应商设备封装： | 48-QFN-EP（7x7） |
| 包装： | 托盘 |
| 工作温度： | -40°C ~ 85°C |
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ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 2. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
Maximum Pin Voltage
CH1 - CH8
GD
PVCC
VDC, OUT_SW
PLLC, ISET, REFIO, VLOGIC, OVP, CS, COMP, SLEW, SYNC_PWM, CLK,
DATA
All other pins
V MAX
45
28
14
6.2
2.6
3.6
V
VIN Input Voltage Range
PVCC Input Voltage Range
DVDD Input Voltage Range
Maximum LED Current - Local Dimming Mode
Maximum LED Current - Scan Mode
V IN
P VCC
D VDD
I LED_LDM
I LED_SM
12 to 28
6.0 to 14
2.6 to 3.6
82
164
V
V
V
mA
mA
ESD Voltage
(1)
V ESD
V
Human Body Model (HBM)
Machine Model (MM)
THERMAL RATINGS
± 2000
± 200
Ambient Temperature Range
Storage Temperature
T A
T STO
-40 to 85
- 40 to 150
° C
° C
Peak Package Reflow Temperature During
Maximum Junction Temperature
Reflow (2) ,
T PPRT
T J_MAX
Note 2
150
°C
° C
Thermal Resistance, Junction to Ambient
(3)
R θ J-A
28
° C/W
Thermal Resistance, Junction to
Case (4)
R θ J-C
2.0
° C/W
Notes
1. ESD testing is performed in accordance with the Human Body Model (HBM) (AEC-Q100-2), and the Machine Model (MM) (AEC-Q100-
003), R ZAP = 0 Ω ).
2.
3.
4.
Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL),Go to www.freescale.com , search by part number [e.g. remove prefixes/suffixes and
enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.
Thermal resistance measured in accordance with EIA/JESD51-2.
Theoretical thermal resistance from the die junction to the exposed pad.
34848
Analog Integrated Circuit Device Data
Freescale Semiconductor
5
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