参数资料
型号: MC74AC574DWR2
厂商: ON Semiconductor
文件页数: 3/10页
文件大小: 0K
描述: IC FLIP-FLOP D OCTAL 3ST 20SOIC
产品变化通告: Reactivation Notice 26/Apr/2011
标准包装: 1
系列: 74AC
功能: 标准
类型: D 型总线
输出类型: 三态非反相
元件数: 1
每个元件的位元数: 8
频率 - 时钟: 95MHz
延迟时间 - 传输: 2ns
触发器类型: 正边沿
输出电流高,低: 24mA,24mA
电源电压: 2 V ~ 6 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 20-SOIC(0.295",7.50mm 宽)
包装: 剪切带 (CT)
其它名称: MC74AC574DWR2OSCT
MC74AC574, MC74ACT574
http://onsemi.com
2
FUNCTIONAL DESCRIPTION
The MC74AC574/74ACT574 consists of eight edge-
triggered flipflops with individual Dtype inputs and
3state true outputs. The buffered clock and buffered Output
Enable are common to all flipflops. The eight flipflops
will store the state of their individual D inputs that meet the
setup and hold time requirements on the LOWtoHIGH
Clock (CP) transition. With the Output Enable (OE) LOW,
the contents of the eight flipflops are available at the
outputs. When OE is HIGH, the outputs go to the high
impedance state. Operation of the OE input does not affect
the state of the flipflops.
FUNCTION TABLE
Inputs
Internal
Outputs
Function
OE
CP
D
Q
On
H
L
NC
Z
Hold
H
HH
NC
Z
Hold
H
LL
Z
Load
H
HH
Z
Load
L
LL
L
Data Available
L
HH
H
Data Available
L
HL
NC
No Change in Data
L
H
NC
No Change in Data
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
= LOW-to-HIGH Clock Transition
NC = No Change
Figure 3. Logic Diagram
D0
D1
D2
D3
D4
D5
D6
D7
CD
Q
O0
O1
O2
O3
O4
O5
O6
O7
OE
CP
CD
Q
CD
Q
CD
Q
CD
Q
CD
Q
CD
Q
CD
Q
NOTE:
This diagram is provided only for the understanding of logic operations
and should not be used to estimate propagation delays.
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage (Referenced to GND)
0.5 to +7.0
V
VIN
DC Input Voltage (Referenced to GND)
0.5 to VCC +0.5
V
VOUT
DC Output Voltage (Referenced to GND)
0.5 to VCC +0.5
V
IIN
DC Input Current, per Pin
±20
mA
IOUT
DC Output Sink/Source Current, per Pin
±50
mA
ICC
DC VCC or GND Current per Output Pin
±50
mA
Tstg
Storage Temperature
65 to +150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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