参数资料
型号: MC74VHC259MG
厂商: ON Semiconductor
文件页数: 4/9页
文件大小: 0K
描述: IC LATCH/DCODE 8BIT ADD 16SOEIAJ
产品变化通告: Product Discontinuation 30/Sept/2011
标准包装: 50
系列: 74VHC
逻辑类型: D 型,可寻址
电路: 1:8
输出类型: 标准
电源电压: 2 V ~ 5.5 V
独立电路: 1
延迟时间 - 传输: 4.9ns
输出电流高,低: 8mA,8mA
工作温度: -55°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 16-SOIC(0.209",5.30mm 宽)
供应商设备封装: 16-SOEIAJ
包装: 管件
MC74VHC259
http://onsemi.com
4
MAXIMUM RATINGS (Note 1.)
Symbol
Parameter
Value
Unit
VCC
Positive DC Supply Voltage
0.5 to +7.0
V
VIN
Digital Input Voltage
0.5 to +7.0
V
VOUT
DC Output Voltage
0.5 to VCC +0.5
V
IIK
Input Diode Current
20
mA
IOK
Output Diode Current
$20
mA
IOUT
DC Output Current, per Pin
$25
mA
ICC
DC Supply Current, VCC and GND Pins
$75
mA
PD
Power Dissipation in Still Air
SOIC Package
TSSOP
200
180
mW
TSTG
Storage Temperature Range
65 to +150
°C
VESD
ESD Withstand Voltage
Human Body Model (Note 2.)
Machine Model (Note 3.)
Charged Device Model (Note 4.)
>2000
>200
>2000
V
ILATCHUP
LatchUp Performance
Above VCC and Below GND at 125°C (Note 5.)
$300
mA
qJA
Thermal Resistance, Junction to Ambient
SOIC Package
TSSOP
143
164
°C/W
1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the
Recommended Operating Conditions.
2. Tested to EIA/JESD22A114A
3. Tested to EIA/JESD22A115A
4. Tested to JESD22C101A
5. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
VCC
DC Supply Voltage
2.0
5.5
V
VIN
DC Input Voltage
0
5.5
V
VOUT
DC Output Voltage
0
VCC
V
TA
Operating Temperature Range, all Package Types
55
125
°C
tr, tf
Input Rise or Fall Time
VCC = 3.3 V + 0.3 V
VCC = 5.0 V + 0.5 V
0
20
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
1
10
100
1000
TIME, YEARS
NORMALIZED
F
AILURE
RA
TE
T J
=
80
T J
=
90
T J
=
100
T J
=
1
10
T J
=
130
T J
=
120
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Figure 5. Failure Rate vs. Time Junction Temperature
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