参数资料
型号: MC9S12C64MPB25
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 16-BIT, FLASH, 25 MHz, MICROCONTROLLER, PQFP52
封装: LQFP-52
文件页数: 12/138页
文件大小: 2318K
代理商: MC9S12C64MPB25
Device User Guide — 9S12C128DGV1/D V01.07
107
B.5.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at
<2ppm defects over lifetime
at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
NOTE:
All values shown in Table B-9 are target values and subject to further extensive
characterization.
Table B-9 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1C
Data Retention at an average junction temperature of
TJavg = 85°C
tNVMRET
15
Years
2
C
Flash number of Program/Erase cycles
nFLPE
10,000
Cycles
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Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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