参数资料
型号: MCM69F536CTQ10R
厂商: MOTOROLA INC
元件分类: SRAM
英文描述: 32K x 36 Bit Flow–Through BurstRAM Synchronous Fast Static RAM
中文描述: 32K X 36 CACHE SRAM, 10 ns, PQFP100
封装: TQFP-100
文件页数: 9/12页
文件大小: 211K
代理商: MCM69F536CTQ10R
MCM69F536C
6
MOTOROLA FAST SRAM
ABSOLUTE MAXIMUM RATINGS (See Note 1)
Rating
Symbol
Value
Unit
Power Supply Voltage
VDD
– 0.5 to 4.6
V
Voltage Relative to VSS for Any
Pin Except VDD
Vin, Vout
– 0.5 to 6.0
V
Output Current (per I/O)
Iout
± 20
mA
Package Power Dissipation (See Note 2)
PD
1.6
W
Temperature Under Bias
Tbias
– 10 to 85
°C
Storage Temperature
Tstg
– 55 to 125
°C
NOTES:
1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER–
ATING CONDITIONS. Exposure to higher than recommended voltages for extended
periods of time could affect device reliability.
2. Power dissipation capability is dependent upon package characteristics and use
environment. See Package Thermal Characteristics.
PACKAGE THERMAL CHARACTERISTICS
Rating
Symbol
Max
Unit
Notes
Thermal Resistance Junction to Ambient (@ 200 lfm)
Single–Layer Board
Four–Layer Board
R
θJA
40
25
°C/W
1, 2
Thermal Resistance Junction to Board (Bottom)
R
θJB
17
°C/W
1, 3
Thermal Resistance Junction to Case (Top)
R
θJC
9
°C/W
1, 4
NOTES:
1. Junction temperature is a function of on–chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient
temperature, air flow, board population, and board thermal resistance.
2. Per SEMI G38–87.
3. Indicates the average thermal resistance between the die and the printed circuit board.
4. Indicates the average thermal resistance between the die and the case top surface via the cold plate method (MIL SPEC–883 Method
1012.1).
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to this high–impedance
circuit.
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