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| 型号： | MIC280-6YM6 TR |
| 厂商： | Micrel Inc |
| 文件页数： | 4/23页 |
| 文件大小： | 385K |
| 描述： | IC SUPERVISOR THERMAL SOT23-6 |
| 标准包装： | 1 |
| 系列： | IttyBitty® |
| 功能： | 温度监控系统（传感器） |
| 传感器类型： | 内部和外部 |
| 感应温度： | -55°C ~ 125°C，外部传感器 |
| 精确度： | ±2°C（最小值） |
| 拓扑： | ADC，寄存器库 |
| 输出类型： | SMBus? |
| 输出警报： | 无 |
| 输出风扇： | 无 |
| 电源电压： | 3 V ~ 3.6 V |
| 工作温度： | -55°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | SOT-23-6 |
| 供应商设备封装： | SOT-23-6 |
| 包装： | 标准包装 |
| 产品目录页面： | 1083 (CN2011-ZH PDF) |
| 其它名称： | 576-2703-6 |
MIC280
Micrel
MIC280
4
May 2006
Symbol
Parameter
Condition
Min
Typ
Max Units
Serial Data I/O Pin, DATA
V
OL
Low Output Voltage, Note 4
I
OL
= 3mA
0.3
V
I
OL
= 6mA
0.5
V
V
IL
Low Input Voltage
3V d V
DD
d 3.6V
0.8
V
V
IH
High Input Voltage
3V d V
DD
d 3.6V
2.1
5.5
V
C
IN
Input Capacitance
Note 5
10
pF
I
LEAK
Input Current
?
礎
Serial Clock Input, CLK
V
IL
Low Input Voltage
3V d V
DD
d 3.6V
0.8
V
V
IH
High Input Voltage
3V d V
DD
d 3.6V
2.1
5.5
V
C
IN
Input Capacitance
Note 5
10
pF
I
LEAK
Input Current
?
礎
Interrupt Output, /INT
V
OL
Low Output Voltage, Note 4
I
OL
= 3mA
0.3
V
I
OL
= 6mA
0.5
V
t
INT
Interrupt Propagation Delay
from TEMPx < TLOWx or
[t
CONV
] ms
Notes 5, 6
TEMPx > THIGHx or TEMPx >
CRITx to /INT < V
OL
; R
PULLUP
= 10k&
t
nINT
Interrupt Reset Propagation Delay
from read of STATUS or A.R.A. to
1
祍
Note 5, 9
/INT > V
OH
; R
PULLUP
= 10k&
I
LEAK
?
礎
Serial Interface Timing
t
1
CLK (Clock) Period
2.5
祍
t
2
Data In Setup Time to CLK High
100
ns
t
3
Data Out Stable after CLK Low
300
ns
t
4
Data Low Setup Time to CLK Low
Start Condition
100
ns
t
5
Data High Hold Time after CLK
Stop Condition
100
ns
High
t
TO
Bus Timeout
25
30
35
ms
Note 1. Exceeding the absolute maximum rating may damage the device.
Note 2. The device is not guaranteed to function outside its operating range. Final test on outgoing product is performed at T
A
= 25癈.
Note 3. Devices are ESD sensitive. Handling precautions recommended.
Note 4. Current into the /INT or DATA pins will result in self heating of the device. Sink current should be minimized for best accuracy.
Note 5. Guaranteed by design over the operating temperature range. Not 100% production tested.
Note 6. t
INT
and t
CRIT
are equal to t
CONV
.
Note 7. T
D
is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 8.
Note 8. t
CONV
= t
CONV
(local) + t
CONV
(remote). Following the acquisition of either remote or local temperature data, the limit comparisons for that zone
are performed and the device status updated; Status bits will be set and /INT driven active, if applicable.
Note 9. The interrupt reset propogation delay is dominated by the capacitance on the bus.
Note 10. Accuracy specication does not include quantization noise, which may be up to ?/SPAN>
1
/
2
LSB.
Note 11. Tested at 10-bit resolution.
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