参数资料
型号: MIC281-7BM6 TR
厂商: Micrel Inc
文件页数: 4/14页
文件大小: 657K
描述: IC SUPERVISOR THERMAL SOT23-6
标准包装: 3,000
系列: IttyBitty®
功能: 温度监控系统(传感器)
传感器类型: 外部
感应温度: 外部传感器
精确度: ±3°C(最小值)
拓扑: ADC,寄存器库
输出类型: I²C?/SMBus?
输出警报:
输出风扇:
电源电压: 3 V ~ 3.6 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: SOT-23-6
供应商设备封装: SOT-23-6
包装: 带卷 (TR)
其它名称: MIC281-7BM6TR
MIC281-7BM6TR-ND
icrel, Inc.
MIC281
 
 
pril 23, 2014
4
Revision 2.0
 
Electrical Characteristics
(5)
 (Continued)
 
 
V
DD
 = 3.3V; T
A
 = 25癈, unless noted. Bold values indicate T
MIN
 d T
A
 d T
MAX
, unless noted
(3)
.
Symbol
Parameter
Condition
Min.
Typ.
Max.
Units
Serial Data I/O Pin, DATA
V
OL
 
Low Output Voltage, Note 6
I
OL
 = 3mA
 
 
0.3
V
I
OL
 = 6mA
 
 
0.5
V
V
IL
 
Low Input Voltage
3V d V
DD
 d 3.6V
 
 
0.8
V
V
IH
 
High Input Voltage
3V d V
DD
 d 3.6V
2.1
 
5.5
V
C
IN
 
Input Capacitance
Note 7
 
10
 
pF
I
LEAK
 
Input Current
 
 
 
?
Serial Clock Input, CLK
V
IL
 
Low Input Voltage
3V d V
DD
 d 3.6V
 
 
0.8
V
V
IH
 
High Input Voltage
3V d V
DD
 d 3.6V
2.1
 
5.5
V
C
IN
 
Input Capacitance
Note 7
 
10
 
pF
I
LEAK
 
Input Current
 
 
 
?
Serial Interface Timing
t
1
 
CLK (clock) Period
 
2.5
 
 
t
2
 
Data In Setup Time to CLK High    
100
 
 
ns
t
3
 
Data Out Stable after CLK Low     
300
 
 
ns
t
4
 
Data Low Setup Time to CLK
Low
Start Condition
100
 
 
ns
t
5
 
Data High Hold Time after CLK
High
Stop Condition
100
 
 
ns
t
TO
 
Bus Timeout
 
25
30
35
ms
Notes:
2.   Exceeding the absolute maximum ratings may damage the device.
3.   The device is not guaranteed to function outside its operating ratings. Final test on outgoing product is performed at T
A
 = 25癈.
4.   Devices are ESD sensitive. Handling precautions are recommended. Human body model, 1.5k& in series with 100pF.
5.   Specification for packaged product only.
6.   Current into the DATA pin will result in self-heating of the device. Sink current should be minimized for best accuracy.
7.   Guaranteed by design over the operating temperature range. Not 100% production tested.
8.   Accuracy specification does not include quantization noise, which may be up to ?/2 LSB.
9.   TD is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 4.
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