参数资料
型号: MMA6527KW
厂商: Freescale Semiconductor
文件页数: 24/56页
文件大小: 0K
描述: IC ACCELEROMETER XY AXIS 16QFN
标准包装: 75
轴: X,Y
加速范围: ±120g
灵敏度: 16 LSB/g
电源电压: 3.13 V ~ 5.25 V
输出类型: SPI
接口: SPI
安装类型: 表面贴装
封装/外壳: 16-QFN 裸露焊盘
供应商设备封装: 16-QFN-EP(6x6)
3.6
Self Test Interface
When self test is enabled, the self test interface applies a voltage to the g-cell, causing a deflection of the proof mass. Once
enabled, offset cancellation is suspended and the deflection results in an acceleration which is superimposed upon the input ac-
celeration.
The resulting acceleration readings can be compared either against absolute limits, or the values stored in the Self Test De-
flection Registers (Reference Section 3.1.2 ). The self test interface is controlled through SPI write operations to the DEVCFG_X
and DEVCFG_Y registers described in Section 3.1.7 only if the ENDINIT bit in the DEVCFG register is cleared. A diagram of the
self test interface is shown in Figure 10 .
ST_Y
ENDINIT
Y-AXIS
g-CELL
SELF TEST
VOLTAGE
ENDINIT
GENERATOR
ENDINIT
X-AXIS
g-CELL
ST_X
Figure 10. Self Test Interface
3.6.1
Raw Self Test Deflection Verification
The raw self test deflection can be directly verified against raw self test limits listed in Section 2.4 .
3.6.2
Delta Self Test Deflection Verification
Δ ST ACCMINLIMIT = FLOOR ? ? ? Δ ST MIN + ------------------------------------------ × [ Δ ST MAX – Δ ST MIN ] ? ? × ( 1 – Δ ST ACC )
Δ ST ACCMAXLIMIT = CEIL ? ? ? Δ ST MIN + ------------------------------------------ × [ Δ ST MAX – Δ ST MIN ] ? ? × ( 1 + Δ ST ACC )
The raw self test deflection can be verified against the ambient temperature self test deflection value recorded at the time the
device was produced. The production self test deflection is stored in the STDEFL_X and STDDEFL_Y registers such that the
minimum stored value (0x00) is equivalent to Δ ST MIN , and the maximum stored value (0xFF) is equivalent to Δ ST MAX . The Delta
Self Test Deflection limits can then be determined by the following equations:
Δ STDEFLx CNTS
255
Δ STDEFLx CNTS
255
where:
Δ ST ACC
Δ STDEFLx CNTS
Δ ST MIN
Δ ST MAX
The accuracy of the self test deflection relative to the stored deflection as specified in Section 2.4 .
The value stored in the STDEFL_X or STDEFL_Y register.
The minimum self test deflection at 25C as specified in Section 2.4 .
The maximum self test deflection at 25C as specified in Section 2.4 .
MMA65xx
Sensor
24
Freescale Semiconductor, Inc.
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