参数资料
型号: MMA7660FCR1
厂商: Freescale Semiconductor
文件页数: 8/35页
文件大小: 0K
描述: ACCELEROMETER 3X3 DGTL 10-DFN
特色产品: MMA7660 Digital Output Accelerometer
标准包装: 1
系列: *
其它名称: MMA7660FCR1DKR
Table 4. Operating Characteristics
Unless otherwise noted: -40°C < T A < 85°C, 2.4 V < AV DD < 3.6 V, 1.71 V < DV DD < 3.6 V, Acceleration = 0g
Typical values are at AV DD = 2.8 V, DV DD = 2.8 V, T A = +25°C
Characteristics
Symbol
Min
Typ
Max
Unit
Analog Supply Voltage
Standby/Operation Mode
Enable Bus Modeon Mode
AV DD
AV DD
2.4
2.8
0
3.6
V
V
Digital I/O Pins Supply Voltage
Standby/Operation Mode
Enable Bus Modeon Mode
DV DD_IO
DV DD_IO
1.71
1.71
2.8
1.8
AV DD
3.6
V
V
Supply Current Drain
Off Mode
Power Down Mode
I DD
I DD
0.4
2
μA
μA
Standby Mode (1)
Active Mode, ODR = 1
Active Mode, ODR = 2
Active Mode, ODR = 4
Active Mode, ODR = 8
Active Mode, ODR = 16
Active Mode, ODR = 32
Active Mode, ODR = 64
Active Mode (1) , ODR = 120
I DD
I DD
I DD
I DD
I DD
I DD
I DD
I DD
I DD
0
2
47
49
54
66
89
133
221
294
10
μA
μA
μA
μA
μA
μA
μA
μA
μA
Acceleration Range
±1.5
g
Operating Temperature Range
T A
-40
25
85
°C
0g Output Signal (T A = 25°C, AV DD = 2.8 V)
0g Offset ±1.5g range (1)
V OFF
-3
0
3
counts
0g Offset Temperature Variation
X
Y
Z
Sensitivity (1) (T A = 25°C, AV DD = 2.8 V)
±1.5g range 6-bit
-1.3
+1.5
-1.0
21.33
mg/°C
mg/°C
mg/°C
count/g
Acceleration Sensitivity at T AMB
Acceleration Sensitivity Temperature Variation
19.62
21.33
±0.01
23.04
count/g
%/°C
Input High Voltage
Input Low Voltage
V IH
V IL
0.7 x D VDD
0.35 x D VDD
Output Low Voltage (IOL = 6 mA + SDA, INT)
Input Leakage Current
V OL
I IH , I IL
0.025
0.5
V
μA
Internal Clock Frequency (1) (T A = 25°C, AV DD = 2.8 V)
t CLK
135
150
165
kHz
I 2 C Interface Speed
Control Timing
Turn on time from AV DD = 0 V to AV DD = 2.5 V (2)
Turn off time from Active to Standby Mode
Turn on time Standby to Active Mode
400
1.3
1
12 ms + 1/ODR
kHz
ms
ms
ms
Timing Clock Source Accuracy (T A = 25°C, DV DD = 1.8 V)
Timing Clock Source Temperature Variation
-10
-15
10
15
%
%
Cross Axis Sensitivity
Noise (4)
±1
±1
%
count
Notes
1.
2.
3.
4.
These parameters are tested in production at final test.
Assuming VDD power on slope is < 1 ms.
A measure of the devices ability to reject an acceleration applied 90° from the true axis of sensitivity.
Noise is defined as quantiles given to a sample size. These are the occurrences of noise: 94% = ±1 count, 5% = ±2 counts, and 1% = ±3
counts.
MMA7660FC
Sensors
Freescale Semiconductor, Inc.
8
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