参数资料
型号: MOC3052SR2M_F132
厂商: Fairchild Semiconductor
文件页数: 7/15页
文件大小: 0K
描述: OPTOCOUPLER TRIAC RANDOM 6-SMD
标准包装: 1,000
电压 - 隔离: 7500Vpk
通道数: 1
电压 - 断路: 600V
输出类型: 交流标准三端双向可控硅开关
电流 - 栅极触发电流 (Igt)(最大): 10mA
电流 - 保持 (Ih): 280µA
电流 - DC 正向(If): 60mA
安装类型: 表面贴装
封装/外壳: 6-SMD
供应商设备封装: 6-SMD
包装: 带卷 (TR)
t(delay), t(f) versus I FT
The triac driver’s turn on switching speed consists of a
turn on delay time t(d) and a fall time t(f). Figure 12
shows that the delay time depends on the LED trigger
current, while the actual trigger transition time t(f) stays
constant with about one micro second.
The delay time is important in very short pulsed opera-
tion because it demands a higher trigger current at very
short trigger pulses. This dependency is shown in the
graph I FT vs. LED PW.
The turn on transition time t(f) combined with the power
triac’s turn on time is important to the power dissipation
of this device.
SCOPE
1. The mercury wetted relay provides a high speed
repeated pulse to the D.U.T.
2. 100x scope probes are used, to allow high speeds and
voltages.
3. The worst-case condition for static dv/dt is established
by triggering the D.U.T. with a normal LED input
current, then removing the current. The variable R TEST
allows the dv/dt to be gradually increased until the
D.U.T. continues to trigger in response to the applied
voltage pulse, even after the LED current has been
removed. The dv/dt is then decreased until the D.U.T.
stops triggering. τ RC is measured at this point and
recorded.
IFT
ZERO CROSS
DETECTOR
115 VAC
VTM
EXT. SYNC
PHASE CTRL.
t(d)
t(f)
FUNCTION
GENERATOR
Vout
PW CTRL.
PERIOD CTRL.
Vo AMPL. CTRL.
ISOL. TRANSF.
10 k Ω
VTM
DUT
IFT
AC
100 Ω
Figure 11. Switching Time Test Circuit
10
+400
Vdc
R TEST
R = 1 k Ω
1
td
PULSE
INPUT
MERCURY
WETTED
RELAY
CTEST
D.U.T.
X100
SCOPE
PROBE
tf
APPLIED VOLTAGE
WAVEFORM
252 V
Vmax = 400 V
0.1
10
20 30 40 50
I FT - LED TRIGGER CURRENT (mA)
60
0 VOLTS
τ RC
0.63 V
dv/dt = τ RC
=
252
τ RC
Figure 12. Delay Time, t(d), and Fall Time, t(f),
vs. LED Trigger Current
?2005 Fairchild Semiconductor Corporation
MOC3051M, MOC3052M Rev. 1.0.7
7
Figure 13. Static dv/dt Test Circuit
www.fairchildsemi.com
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MOC3052SM_F132 OPTOCOUPLER TRIAC RANDOM 6-SMD
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