MPC5607B Microcontroller Data Sheet, Rev. 6
Revision history
Freescale Semiconductor
108
4
(cont.)
24 Aug 2010
(cont.)
Added fVCO row
Added
t
STJIT row
IFIRCPWD: removed row for TA = 55 °C
Updated TFIRCSU row
Table 44: Added two rows: IADC0pwd and IADC0run Added two rows: IADC1pwd and IADC1run
Updated values of fADC_1 and tADC1_PU
Updated tADC1_C row
5
27 Aug 2010 Removed “Preliminary—Subject to Change Without Notice” marking. This data sheet
contains specifications based on characterization data.
6
08 Jul 2011 Editorial and formatting changes throughout
Replaced instances of “e200z0” with “e200z0h”Device family comparision table:
changed LINFlex count for 144-pin LQFP—was ‘6’; is ‘8’
changed LINFlex count for 176-pin LQFP—was ‘8’; is ‘10’
replaced 105 °C with 125 °C in footnote 2
MPC5607B block diagram: added GPIO and VREG to legend
MPC5607B series block summary: added acronym “JTAGC”; in WKPU function changed
“up to 18 external sources” to “up to 27 external sources”
144 LQFP pin configuration: for pins 37–72, restored the pin labels that existed prior to
27 July 2010
176 LQFP pin configuration: corrected name of pin 4: was EPC[15]; is PC[15]
Added following sections:
Pad configuration during reset phases
Pad configuration during standby mode exit
Voltage supply pins
Pad types
System pins
Functional port pins
Nexus 2+ pins
Section “NVUSRO register”: edited content to separate configuration into electrical
parameters and digital functionality; updated footnote describing default value of ‘1’ in
field descriptions NVUSRO[PAD3V5V] and NVUSRO[OSCILLATOR_MARGIN]
Added section “NVUSRO[WATCHDOG_EN] field description”
Tables “Absolute maximum ratings” and “Recommended operating conditions (3.3 V)”:
replaced “VSS_HV_ADC0, VSS_HV_ADC1” with “VDD_HV_ADC0, VDD_HV_ADC1”
in VDD_ADC parameter description
“Recommended operating conditions (5.0 V)” table: replaced “VSS_HV_ADC0,
VSS_HV_ADC1” with “VDD_HV_ADC0, VDD_HV_ADC1” in VDD_ADC parameter
description; changed 3.6V to 3.0V in footnote 2
Table 51. Revision history (continued)
Revision
Date
Substantive changes