参数资料
型号: MPC8349EVVALFA
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, 667 MHz, MICROPROCESSOR, PBGA672
封装: 35 X 35 MM, 1.46 MM HEIGHT, 1 MM PITCH, LEAD FREE, TBGA-672
文件页数: 110/112页
文件大小: 1295K
代理商: MPC8349EVVALFA
MPC8349EA PowerQUICC II Pro Integrated Host Processor Hardware Specifications, Rev. 2
Freescale Semiconductor
97
Thermal
20 Thermal
This section describes the thermal specifications of the MPC8349EA.
20.1
Thermal Characteristics
Table 62 provides the package thermal characteristics for the 672 35
× 35 mm TBGA of the MPC8349EA.
20.2
Thermal Management Information
For the following sections, PD = (VDD × IDD) + PI/O where PI/O is the power dissipation of the I/O drivers.
See Table 5 for I/O power dissipation values.
Table 62. Package Thermal Characteristics for TBGA
Characteristic
Symbol
Value
Unit
Notes
Junction-to-ambient natural convection on single-layer board (1s)
RθJA
14
°C/W
1, 2
Junction-to-ambient natural convection on four-layer board (2s2p)
RθJMA
11
°C/W
1, 3
Junction-to-ambient (@200 ft/min) on single-layer board (1s)
RθJMA
11
°C/W
1, 3
Junction-to-ambient (@ 200 ft/min) on four-layer board (2s2p)
RθJMA
8C/W
1, 3
Junction-to-ambient (@ 2 m/s) on single-layer board (1s)
RθJMA
9C/W
1, 3
Junction-to-ambient (@ 2 m/s) on four-layer board (2s2p)
RθJMA
7C/W
1, 3
Junction-to-board thermal
RθJB
3.8
C/W
4
Junction-to-case thermal
RθJC
1.7
C/W
5
Junction-to-package natural convection on top
ψ
JT
1C/W
6
Notes
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal, 1 m/s is approximately equal to 200 linear feet per minute (LFM).
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
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