参数资料
型号: MPC8541EVTAJFX
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, 1000 MHz, RISC PROCESSOR, CBGA360
封装: 25 X 25 MM, 2.40 MM HEIGHT, 1.27 MM PITCH, ROHS COMPLIANT, HCTE, CERAMIC, BGA-360
文件页数: 65/84页
文件大小: 1241K
代理商: MPC8541EVTAJFX
MPC8541E PowerQUICC III Integrated Communications Processor Hardware Specifications, Rev. 4
68
Freescale Semiconductor
Thermal
Ultimately, the final selection of an appropriate heat sink depends on many factors, such as thermal
performance at a given air velocity, spatial volume, mass, attachment method, assembly, and cost. Several
heat sinks offered by Aavid Thermalloy, Alpha Novatech, IERC, Chip Coolers, Millennium Electronics,
and Wakefield Engineering offer different heat sink-to-ambient thermal resistances, that will allow the
MPC8541E to function in various environments.
16.2.1
Recommended Thermal Model
For system thermal modeling, the MPC8541E thermal model is shown in Figure 42. Five cuboids are used
to represent this device. To simplify the model, the solder balls and substrate are modeled as a single block
29x29x1.6 mm with the conductivity adjusted accordingly. The die is modeled as 8.7 x 9.3 mm at a
thickness of 0.75 mm. The bump/underfill layer is modeled as a collapsed resistance between the die and
substrate assuming a conductivity of 4.4 W/mK in the thickness dimension of 0.07 mm. The lid attach
adhesive is also modeled as a collapsed resistance with dimensions of 8.7 x 9.3 x 0.05 mm and the
conductivity of 1.07 W/mK. The nickel plated copper lid is modeled as 11 x 11 x 1 mm.
Figure 42. MPC8541E Thermal Model
Die
Lid
Substrate and solder balls
Heat Source
Substrate
Side View of Model (Not to Scale)
Top View of Model (Not to Scale)
x
y
z
Conductivity
Value
Unit
Lid
(11
× 11 × 1 mm)
kx
360
W/(m
× K)
ky
360
kz
360
Lid Adhesive—Collapsed resistance
(8.7
× 9.3 × 0.05 mm)
kz
1.07
Die
(8.7
× 9.3 × 0.75 mm)
Bump/Underfill—Collapsed resistance
(8.7
× 9.3 × 0.07 mm)
kz
4.4
Substrate and Solder Balls
(25
× 25 × 1.6 mm)
kx
14.2
ky
14.2
kz
1.2
Adhesive
Bump/underfill
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