参数资料
型号: MPC859PZP133A
厂商: Freescale Semiconductor
文件页数: 6/96页
文件大小: 0K
描述: IC MPU POWERQUICC 133MHZ 357PBGA
标准包装: 44
系列: MPC8xx
处理器类型: 32-位 MPC8xx PowerQUICC
速度: 133MHz
电压: 1.8V
安装类型: 表面贴装
封装/外壳: 357-BBGA
供应商设备封装: 357-PBGA(25x25)
包装: 托盘
MPC866/MPC859 Hardware Specifications, Rev. 2
14
Freescale Semiconductor
Thermal Calculation and Measurement
7.5
Experimental Determination
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characterization parameter (
ΨJT) can be used to determine the junction temperature with a measurement of the
temperature at the top center of the package case using the following equation:
TJ = TT +(ΨJT x PD)
where:
Ψ
JT = thermal characterization parameter
TT = thermocouple temperature on top of package
PD = power dissipation in package
The thermal characterization parameter is measured per JESD51-2 specification published by JEDEC using a 40
gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned
so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple
junction and over about 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the
package case to avoid measurement errors caused by cooling effects of the thermocouple wire.
7.6
References
Semiconductor Equipment and Materials International(415) 964-5111
805 East Middlefield Rd.
Mountain View, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) specifications800-854-7179 or
(Available from Global Engineering Documents)303-397-7956
JEDEC Specifications http://www.jedec.org
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine
Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54.
2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its
Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
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