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参数资料
| 型号： | MSC2383257A-xxDS16 |
| 厂商： | OKI SEMICONDUCTOR CO., LTD. |
| 英文描述： | 8,388,608-Word x 32-Bit DRAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| 中文描述： | 8388608字× 32位DRAM模块：快速页面模式型与江户 |
| 文件页数： | 8/8页 |
| 文件大小： | 71K |
| 代理商： | MSC2383257A-XXDS16 |
MSC2383257A-xxBS16/DS16
Semiconductor
124
See ADDENDUM I for AC Timing Waveforms
Notes:
1. A start-up delay of 200
μ
s is required after power-up, followed by a minimum of eight
initialization cycles (
RAS
-only refresh or
CAS
before
RAS
refresh) before proper device
operation is achieved.
2. The AC characteristics assume t
T
= 5 ns.
3. V
IH
(Min.) and V
IL
(Max.) are reference levels for measuring input timing signals.
Transition times (t
T
) are measured between V
IH
and V
IL
.
4. This parameter is measured with a load circuit equivalent to 2 TTL loads and 100 pF.
5. Operation within the t
RCD
(Max.) limit ensures that t
RAC
(Max.) can be met.
t
RCD
(Max.) is specified as a reference point only. If t
RCD
is greater than the specified
t
RCD
(Max.) limit, access time is controlled by t
CAC
.
6. Operation within the t
RAD
(Max.) limit ensures that t
RAC
(Max.) can be met.
t
RAD
(Max.) is specified as a reference point only. If t
RAD
is greater than the specified
t
RAD
(Max.) limit, access time is controlled by t
AA
.
7. t
CEZ
(Max.), t
REZ
(Max.) and t
WEZ
(Max.) define the time at which the output achieves
the open circuit condition and are not referenced to output voltage levels.
8. t
CEZ
and t
REZ
must be satisfied for open circuit condition.
9. t
RCH
or t
RRH
must be satisfied for a read cycle.
10. The test mode is initiated by performing a
WE
and
CAS
before
RAS
refresh cycle.
This mode is latched and remains in effect until the exit cycle is generated.
The test mode specified in this data sheet is an 8-bit parallel test function. CA0, CA1
and CA10 are not used. In a read cycle, if all internal bits are equal, the DQ pin will
indicate a high level. If any internal bits are not equal, the DQ pin will indicate a low
level. The test mode is cleared and the memory device returned to its normal
operating state by performing a
RAS
-only refresh cycle or a
CAS
before
RAS
refresh
cycle.
The 4M
￥
32 module can be tested as a 512K
￥
32 module in this test mode.
11. In a test mode read cycle, the access time parameters are delayed by 5 ns. The test
mode parameters are obtained by adding 5 ns to the normal read cycle values.
相关PDF资料 |
PDF描述 |
|---|---|
| MSC2383257A | 8,388,608-Word x 32-Bit DRAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC2383257D | 8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC2383257D-xxDS16 | 8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC2383257D-xxBS16 | 8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC23832A | 8,388,608-Word x 32-Bit DRAM MODULE : FAST PAGE MODE TYPE |
相关代理商/技术参数 |
参数描述 |
|---|---|
| MSC2383257D | 制造商:OKI 制造商全称:OKI electronic componets 功能描述:8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC2383257D-XXBS16 | 制造商:OKI 制造商全称:OKI electronic componets 功能描述:8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC2383257D-XXDS16 | 制造商:OKI 制造商全称:OKI electronic componets 功能描述:8,388,608-word x 32-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE WITH EDO |
| MSC23832A | 制造商:OKI 制造商全称:OKI electronic componets 功能描述:8,388,608-Word x 32-Bit DRAM MODULE : FAST PAGE MODE TYPE |
| MSC23832A-XXBS16 | 制造商:OKI 制造商全称:OKI electronic componets 功能描述:8,388,608-Word x 32-Bit DRAM MODULE : FAST PAGE MODE TYPE |
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