参数资料
型号: MSC23836C-xxDS20
厂商: OKI SEMICONDUCTOR CO., LTD.
英文描述: 8,388,608-word x 36-bit DYNAMIC RAM MODULE : FAST PAGE MODE TYPE
中文描述: 8388608字× 36位动态随机存储器模块:快速页面模式型
文件页数: 9/9页
文件大小: 51K
代理商: MSC23836C-XXDS20
Semconductor
MSC23836C
Notes: 1. A start-up delay of 200
μ
s is required after power-up, followed by a minimum of eight initialization cycles
(/RAS only refresh or /CAS before /RAS refresh) before proper device operation is achieved.
2. The AC characteristics assume t
T
= 5ns.
3. V
IH
(Min.) and V
IL
(Max.) are reference levels for measuring input timing signals. Transition times (t
T
) are
measured between V
IH
and V
IL
.
4. This parameter is measured with a load circuit equivalent to 2TTL loads and 100pF.
5. Operation within the t
RCD
(Max.) limit ensures that t
RAC
(Max.) can be met.
t
RCD
(Max.) is specified as a reference point only. If t
RCD
is greater than the specified t
RCD
(Max.) limit, then
the access time is controlled by t
CAC
.
6. Operation within the t
RAD
(Max.) limit ensures that t
RAC
(Max.) can be met.
t
RAD
(Max.) is specified as a reference point only. If t
RAD
is greater than the specified t
RAD
(Max.) limit, then
the access time is controlled by t
AA
.
7. t
OFF
(Max.) define the time at which the output achieves the open circuit condition and is not referenced
to output voltage levels.
8. t
RCH
or t
RRH
must be satisfied for a read cycle.
9. The test mode is initiated by performing a /WE and /CAS before /RAS refresh cycle. This mode is
latched and remains in effect until the exit cycle is generated. The test mode specified in this data sheet
is a 4-bit parallel test function. CA0 and CA1 are not used. In a read cycle, if all internal bits are equal,
the DQ pin will indicate a high level. If any internal bits are not equal, the DQ pin will indicate a low level.
The test mode is cleared and the memory device returned to its normal operating state by a /RAS only
refresh or /CAS before /RAS refresh cycle.
10. In a test mode read cycle, the value of access time parameters is delayed for 5ns for the specified value.
These parameters should be specified in test mode cycle by adding the above value to the specified
value in this data sheet.
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