参数资料
型号: MSP430F122IDWR
厂商: TEXAS INSTRUMENTS INC
元件分类: 微控制器/微处理器
英文描述: 16-BIT, FLASH, 8 MHz, RISC MICROCONTROLLER, PDSO28
封装: GREEN, PLASTIC, SOIC-28
文件页数: 10/42页
文件大小: 788K
代理商: MSP430F122IDWR
MSP430x12x
MIXED SIGNAL MICROCONTROLLER
SLAS312C JULY 2001 REVISED SEPTEMBER 2004
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (continued)
Comparator_A (see Note 1)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
UNIT
I()
CAON=1 CARSEL=0 CAREF=0
2.2 V
25
40
μA
I(DD)
CAON=1, CARSEL=0, CAREF=0
3 V
45
60
μA
I(Refladder/
CAON=1, CARSEL=0,
CAREF 1/2/3 No load at
2.2 V
30
50
μA
I(Refladder/
RefDiode)
CAREF=1/2/3, No load at
P2.3/CA0/TA1 and P2.4/CA1/TA2
3 V
45
71
μA
V(IC)
Common-mode input voltage
CAON =1
2.2 V/3 V
0
VCC1
V
V(Ref025)
Voltage at 0.25 V
CC
node
V
CC
PCA0=1, CARSEL=1, CAREF=1,
No load at P2.3/CA0/TA1 and
P2.4/CA1/TA2
2.2 V/3 V
0.23
0.24
0.25
V(Ref050)
Voltage at 0.5V
CC
node
V
CC
PCA0=1, CARSEL=1, CAREF=2,
No load at P2.3/CA0/TA1 and
P2.4/CA1/TA2
2.2 V/3 V
0.47
0.48
0.5
V
PCA0=1, CARSEL=1, CAREF=3,
No load at P2 3/CA0/TA1 and
2.2 V
390
480
540
mV
V(RefVT)
No load at P2.3/CA0/TA1 and
P2.4/CA1/TA2, TA = 85°C
3 V
400
490
550
mV
V(offset)
Offset voltage
See Note 2
2.2 V/3 V
30
mV
Vhys
Input hysteresis
CAON=1
2.2 V/3 V
0
0.7
1.4
mV
TA = 25°C, Overdrive 10 mV,
2.2 V
160
210
300
ns
t
TA = 25 C, Overdrive 10 mV,
Without filter: CAF=0
3 V
80
150
240
ns
t(response LH)
TA = 25°C, Overdrive 10 mV,
2.2 V
1.4
1.9
3.4
μs
TA = 25 C, Overdrive 10 mV,
With filter: CAF=1
3 V
0.9
1.5
2.6
μs
TA = 25°C,
2.2 V
130
210
300
ns
t
TA = 25 C,
Overdrive 10 mV, without filter: CAF=0
3 V
80
150
240
ns
t(response HL)
TA = 25°C,
2.2 V
1.4
1.9
3.4
μs
TA = 25 C,
Overdrive 10 mV, with filter: CAF=1
3 V
0.9
1.5
2.6
μs
NOTES: 1. The leakage current for the Comparator_A terminals is identical to Ilkg(Px.x) specification.
2. The input offset voltage can be cancelled by using the CAEX bit to invert the Comparator_A inputs on successive measurements.
The two successive measurements are then summed together.
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