参数资料
型号: N74F166D-T
厂商: NXP SEMICONDUCTORS
元件分类: 计数移位寄存器
英文描述: 8-bit bidirectional universal shift register - Description: 8-Bit Bidirectional Universal Shift Register ; F<sub>max</sub>: 175 MHz; Logic switching levels: TTL ; Number of pins: 16 ; Output drive capability: -1/+20 mA ; Propagation delay: 7.5 ns; Voltage: 4.5-5.5 V
中文描述: F/FAST SERIES, 8-BIT RIGHT PARALLEL IN SERIAL OUT SHIFT REGISTER, TRUE OUTPUT, PDSO16
封装: PLASTIC, SO-16
文件页数: 9/12页
文件大小: 105K
代理商: N74F166D-T
Philips Semiconductors
Product specification
74F166
8-bit bidirectional universal shift register
Feb. 14, 1991
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
VOH
High–level output voltage
VCC = MIN, VIL =
MAX,
IOH = MAX
±10%V
CC
2.5
V
VIH = MIN
±5%V
CC
2.7
3.4
V
VOL
Low–level output voltage
VCC = MIN, VIL =
MAX,
IOL = MAX
±10%V
CC
0.30
0.50
V
VIH = MIN
±5%V
CC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
-0.73
-1.2
V
II
Input current at maximum
others
VCC = 0.0V, VI = 7.0V
100
A
input voltage
CE, CP3
others
20
A
IIH
High–level input
MR, Ds
VCC = MAX, VI = 2.7V
40
A
current
Industrial
others
40
A
only
MR, Ds
80
A
IIL
Low–level input current
others
VCC = MAX, VI = 0.5V
-20
A
MR, Ds
-40
A
IOS
Short–circuit output current4
VCC = MAX
-60
-150
mA
ICC
Supply current (total)
VCC = MAX, PE = CE = Dn = GND,
MR = Ds = 4.5V, CP =
50
70
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. When testing CP, CE must remain in high state, whereas CP must remain in high state when testing CE.
4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
Tamb = +25°C
Tamb = 0°C to
+70
°C
Tamb = –40°C to +85°C
SYMBOL
PARAMETER
TEST
VCC = +5.0V
VCC = +5.0V ± 10%
UNIT
CONDITION
CL = 50pF,
RL = 500
CL = 50pF,
RL = 500
CL = 50pF,
RL = 500
MIN
TYP
MAX
MIN
MAX
MIN
MAX
fmax
Maximum clock frequency
Waveform 1
135
175
110
100
ns
tPLH
tPHL
Propagation delay
CP to Q7
Waveform 1
5.0
4.0
7.5
6.0
10.0
8.0
5.0
3.5
12.0
9.0
5.0
3.5
13.0
9.0
ns
tPHL
Propagation delay
MR to Q7
Waveform 2
4.0
6.5
8.5
4.0
9.5
4.0
9.5
ns
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