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参数资料
| 型号： | N74F298N |
| 厂商： | NXP Semiconductors N.V. |
| 元件分类： | 通用总线功能 |
| 英文描述： | Quad 2-input multiplexer with storage |
| 封装： | N74F298D<SOT109-1 (SO16)|<<http://www.nxp.com/packages/SOT109-1.html<1<week 6, 2004,;N74F298D<SOT109-1 (SO16)|<<http://www.nxp.com/packages/SOT109-1.html<1<week 6, |
| 文件页数： | 4/8页 |
| 文件大小： | 87K |
| 代理商： | N74F298N |
Philips Semiconductors
Product specification
74F298
Quad 2-input multiplexer with storage
1989 Aug 14
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
High-level input voltage
2.0
V
V
IL
Low-level input voltage
0.8
V
I
IK
Input clamp current
–18
mA
I
OH
High-level output current
–1
mA
I
OL
Low-level output current
20
mA
T
amb
Operating free-air temperature range
0
70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
V
OH
High level output voltage
High-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OH
= –MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
IL
,
2.7
3.4
V
V
OL
Low level output voltage
Low-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN, I
OL
=– MAX
0.30
0.50
V
IL
,
0.30
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
OS
Short-circuit output current
NO TAG
V
CC
= MAX
–60
–150
mA
I
CC
Supply current (total)
I
CCH
V
CC
= MAX
30
40
mA
I
CCL
32
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
T
amb
= +25
°
C
V
CC
= +5.0V
C
L
= 50pF
R
L
= 500
T
amb
= 0
°
C to +70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF
R
L
= 500
UNIT
MIN
TYP
MAX
MIN
MAX
f
MAX
Maximum clock frequency
Waveform
NO TAG
110
115
105
ns
t
PLH
t
PHL
Propagation delay
CP tp Qn
Waveform
NO TAG
4.0
4.5
5.5
6.5
7.5
8.5
4.0
4.5
9.0
9.5
ns
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