参数资料
| 型号： | N74F367N,602 |
| 厂商： | NXP Semiconductors |
| 文件页数： | 5/9页 |
| 文件大小： | 0K |
| 描述： | IC BUFFER DVR HEX N-INV 16PDIP |
| 产品培训模块： | Logic Packages |
| 标准包装： | 25 |
| 系列： | 74F |
| 逻辑类型： | 缓冲器/线路驱动器，非反相 |
| 元件数： | 2 |
| 每个元件的位元数： | 2，4（六路） |
| 输出电流高，低： | 15mA，64mA |
| 电源电压： | 4.5 V ~ 5.5 V |
| 工作温度： | 0°C ~ 70°C |
| 安装类型： | 通孔 |
| 封装/外壳： | 16-DIP（0.300"，7.62mm） |
| 供应商设备封装： | 16-DIP |
| 包装： | 管件 |
| 其它名称： | 568-3179-5 933747090602 N74F367N |
Philips Semiconductors
Product data
74F367
Hex buffer/driver
2004 Jan 30
5
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
VCC = MIN; VIL = MAX;
± 10% VCC
2.4
–
V
VO
HIGH level output voltage
CC
IL
VIH = MIN; IOH = –3 mA
± 5% VCC
2.7
3.3
–
V
VOH
HIGH-level output voltage
VCC = MIN; VIL = MAX;
± 10% VCC
2.0
–
V
CC
IL
VIH = MIN; IOH = –15 mA
± 5% VCC
2.0
–
V
VO
Low level output voltage
VCC = MIN; VIL = MAX;
± 10% VCC
–
0.55
V
VOL
Low-level output voltage
CC
IL
VIH = MIN; IOL = MAX
± 5% VCC
–
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN; II = IIK
–
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0 V; VI = 7.0 V
–
100
A
IIH
HIGH-level input current
VCC = MAX; VI = 2.7 V
–
20
A
IIL
LOW-level input current
VCC = MAX; VI = 0.5 V
–
–20
A
IOZH
Off-state output current,
HIGH-level voltage applied
VCC = MAX; VO = 2.7 V
–
50
A
IOZL
Off-state output current,
LOW-level voltage applied
VCC = MAX; VO = 0.5 V
–
–50
A
IOS
Short-circuit output current3
VCC = MAX
–100
–
–225
mA
ICCH
–
25
35
mA
ICC
Supply current (total)
ICCL
VCC = MAX
–
47
62
mA
ICCZ
–
35
48
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5 V, Tamb = 25 °C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.
In any sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
Tamb = +25 °C
Tamb = –55 °C to +125 °C
SYMBOL
PARAMETER
TEST CONDITIONS
VCC = +5.0 V
VCC = +5.0 V ± 10%
UNIT
CL = 50 pF; RL = 500
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
Waveform 1
2.5
4.5
5.5
6.5
7.0
2.0
7.0
7.5
ns
tPZH
tPZL
Output Enable time
to HIGH or LOW level
Waveform 2
Waveform 3
3.0
5.5
6.5
7.5
8.5
3.0
8.5
9.0
ns
tPHZ
tPLZ
Output Disable time
from HIGH to LOW level
Waveform 2
Waveform 3
2.0
4.5
4.0
6.5
2.0
7.0
ns
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相关代理商/技术参数 |
参数描述 |
|---|---|
| N74F367N-B | 制造商:未知厂家 制造商全称:未知厂家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368D | 制造商:未知厂家 制造商全称:未知厂家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368DB | 制造商:未知厂家 制造商全称:未知厂家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368D-T | 制造商:未知厂家 制造商全称:未知厂家 功能描述:2-Bit/4-Bit Buffer/Driver |
| N74F368N | 制造商:未知厂家 制造商全称:未知厂家 功能描述:2-Bit/4-Bit Buffer/Driver |
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