
Philips Semiconductors
Product specification
74F657
Octal transceiver with 8-bit parity generator/checker
90 July 30
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
All outputs
IOH = –3mA4,5
±10%VCC
2.4
V
VCC = MIN,
±5%VCC
2.7
V
VOH
High-level output voltage
B0 – B7,
VIL = MAX,
IOH = –12mA5
±10%VCC
2.0
V
PARITY,
VIH = MIN
±5%VCC
2.0
V
ERROR
IOH = –15mA4
±10%VCC
2.0
V
±5%VCC
2.0
V
A0 – A7
IOL = 24mA4,5
±10%VCC
0.35
0.50
V
VCC = MIN,
±5%VCC
0.35
0.50
V
VOL
Low-level output voltage
B0 – B7,
VIL = MAX,
IOL = 48mA4
±10%VCC
0.38
0.55
V
PARITY,
VIH = MIN
IOL = 48mA5
±5%VCC
0.42
0.55
V
ERROR
IOL = 64mA4
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
-1.2
V
Input current at
OE, T/R,
ODD/EVEN
VCC = 0.0V, VI = 7.0V
100
A
II
maximum input voltage
A0 – A7
VCC = 5.5V, VI = 5.5V
2
mA
B0 – B7
1
mA
OOD/EVEN
204
A
IIH
High–level input current
VCC = MAX, VI = 2.7V
405
A
OE, T/R
404
A
805
A
IIL
Low–level input current
OOD/EVEN
VCC = MAX, VI = 0.5V
–20
A
OE, T/R
–40
A
IOZH + IIH
Off–state output current,
high–level voltage applied
A0 – A7,
B0 – B7,
VCC = MAX, VO = 2.7V
70
A
IOZL + IIL
Off–state output current,
low–level voltage applied
PARITY
VCC = MAX, VO = 0.5V
–70
A
IOZH
Off–state output current,
High–level voltage applied
ERROR
VCC = MAX, VO = 2.7V
50
A
IOZL
Off–state output current,
low–level voltage applied
VCC = MAX, VO = 0.5V
–50
A
IOS
Short circuit output current3
A0 – A7
VCC = MAX
-60
-150
mA
B0 – B7
-100
-225
mA
ICCH
90
1254
mA
90
1355
mA
ICC
Supply current (total)
ICCL
VCC = MAX
106
1504
mA
106
1605
mA
ICCZ
98
145
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. For commercial range.
5. For industrial range.