
Philips Semiconductors
Product specification
74F723A/74F723–1/
74F725A/74F725–1
Multiplexers
1990 Dec 13
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
IO = 3mA
±10%VCC
2.4
V
VO
High level output voltage
VCC = MIN,
V
MAX
IOH = –3mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
VIL = MAX,
VIH = MIN
IO = 15mA
±10%VCC
2.0
V
IH
IOH = –15mA
±5%VCC
2.0
V
74F723-1/
IO = 5mA
±10%VCC
0.38
0.50
V
VO
Low level output voltage
74F723 1/
74F725-1
VCC = MIN,
V
MAX
IOL = 5mA
±5%VCC
0.38
0.50
V
VOL
Low-level output voltage
74F723A/
VIL = MAX,
VIH = MIN
IO = MAX
±10%VCC
0.38
0.55
V
74F723A/
74F725A
IH
IOL = MAX
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
I
Low level input current
Others
VCC = MAX V =0 5V
–20
A
IIL
Low-level input current
Dn only
VCC = MAX, VI = 0.5V
–40
A
IOZH
Off-state output current
High-level voltage
applied
74F723A/
74F723 1
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current
Low-level voltage
applied
74F723-1
only
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output
current3
74F723-1/
74F725-1
VCC = MAX
–60
–150
mA
IO
Output currentNO TAG
74F723A/
74F725A
VCC = MAX, VO = 2.25V
–60
–150
mA
ICCH
23
30
mA
74F723A
ICCL
VCC = MAX
29
40
mA
ICCZ
25
40
mA
ICCH
23
35
mA
ICC
Supply
current
74F723-1
ICCL
VCC = MAX
29
40
mA
ICC
current
(total)
ICCZ
26
40
mA
()
74F725A
ICCH
VCC = MAX
16
25
mA
74F725A
ICCL
VCC = MAX
24
35
mA
74F725 1
ICCH
VCC = MAX
17
25
mA
74F725-1
ICCL
VCC = MAX
25
35
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. IO is tested under conditions that produce current approximity one half of the true short-circuit output current (IOS).