参数资料
型号: NBXDBA015LNHTAG
厂商: ON Semiconductor
文件页数: 2/6页
文件大小: 0K
描述: IC OSC XTAL 206.9MHZ 6-CLCC
标准包装: 100
系列: PureEdge™
类型: 振荡器 - 晶体
频率: 200MHz,206.9MHz
电源电压: 2.97 V ~ 3.63 V
电流 - 电源: 82mA
工作温度: -40°C ~ 85°C
封装/外壳: 6-CLCC
包装: 带卷 (TR)
供应商设备封装: 6-CLCC(7x5)
安装类型: 表面贴装
NBXDBA015, NBXDBB015
http://onsemi.com
2
Figure 2. Pin Connections (Top View)
FSEL
OE
GND
CLK
VDD
CLK
1
2
3
6
5
4
Table 1. PIN DESCRIPTION
Pin No.
Symbol
I/O
Description
1
OE
LVTTL/LVCMOS
Control Input
Output Enable Pin. When left floating pin defaults to logic HIGH and output is active.
See OE pin description Table 2.
2
FSEL
Control Input
Output Frequency Select Pin. Pin will default LOW when left open. See Output Fre-
quency Select Table 3.
3
GND
Power Supply
Ground 0 V.
4
CLK
LVPECL Output
NonInverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD 2 V.
5
CLK
LVPECL Output
Inverted Clock Output. Typically loaded with 50 W receiver termination resistor to
VTT = VDD 2 V.
6
VDD
Power Supply
Positive power supply voltage. Voltage should not exceed 3.3 V ±10%.
Table 2. OUTPUT ENABLE TRISTATE FUNCTION
OE Pin
Output Pins
Open
Active
High Level
Active
Low Level
High Z
Table 3. OUTPUT FREQUENCY SELECT
FSEL Pin
Output Frequency (MHz)
Open
(pin will float Low)
200
High Level
206.9
Low Level
200
Table 4. ATTRIBUTES
Characteristic
Value
Input Default State Resistor
170 kW
ESD Protection
Human Body Model
Machine Model
2 kV
200 V
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
1. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
Table 5. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
VDD
Positive Power Supply
GND = 0 V
4.6
V
Iout
LVPECL Output Current
Continuous
Surge
25
50
mA
TA
Operating Temperature Range
40 to +85
°C
Tstg
Storage Temperature Range
55 to +120
°C
Tsol
Wave Solder
See Figure 6
260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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