参数资料
型号: NC7SP00L6X
厂商: Fairchild Semiconductor
文件页数: 3/7页
文件大小: 0K
描述: IC GATE NAND ULP 2-INP 6MICROPAK
产品变化通告: Die Material, Mold Compound Change 03/Oct/2008
标准包装: 1
系列: 7SP
逻辑类型: 与非门
电路数: 1
输入数: 2
电源电压: 0.9 V ~ 3.6 V
电流 - 静态(最大值): 0.9µA
输出电流高,低: 2.6mA,2.6mA
逻辑电平 - 低: 0.7 V ~ 0.9 V
逻辑电平 - 高: 1.6 V ~ 2.1 V
额定电压和最大 CL 时的最大传播延迟: 7ns @ 3V ~ 3.6V,30pF
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
供应商设备封装: Micro6?(TSOP-6)
封装/外壳: 6-UFDFN
包装: 标准包装
其它名称: NC7SP00L6XFSDKR
3
PS8862L
05/01/09
PI6C10807
1.8V/2.5V, 250MHz, 1:10 Networking Clock Buffer
1.8V AC Characteristics (Over Operating Range: VDD = 1.8V ± 0.15V, TA = -40° to 85°C)
Parameters
Description
Test Conditions
(1)
Min.
Typ
Max.
Units
FIN
Input Frequency
0
180
MHz
tR/tF
CLKn Rise/Fall Time
20% to 80%
1.0
ns
tSK(P)3. 5
Pulse Skew between opposite transitions
(tPHL-tPLH) of the same output
Vin > VDD
CL = 5pF, 125 MHz
100
200
ps
tPLH, tPHL2, 5
Propagation Delay BUF_IN to CLKn
CL = 5pF, 125 MHz
1.0
1.5
2.0
ns
tSK(O)3, 5
Output to Output Skew between any two
outputs of the same device @ same transition
60
ps
tSK(T)3, 5
Part to Part Skew between two identical out-
puts of different parts on the same board4
300
tdc_in 5
Duty Cycle In @ Ins edge rate
45
55
%
tdc_out 5
Duty Cycle Out
40
57.5
Notes:
1. See test circuit and waveforms
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew measured at worst case temperature (max. temp).
4. Identical conditions: loading, transitions, supply voltage, temperature, package type and speed grade..
5. Outputs are measured at VDD/2
Storage Temperature...........................................................–65°C to +150°C
VDD Voltage ..........................................................................–0.5V to +2.5V
Output Voltage (max 2.5V) .......................................... –0.5V to VDD+0.5V
Input Voltage (max 2.5V) ............................................. –0.5V to VDD+0.5V
1.8V Absolute Maximum Ratings (Above which the useful life may be impaired. For user guidelines only, not tested.)
Note: Stresses greater than those listed under MAXI-
MUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation
of the device at these or any other conditions above those
indicated in the operational sections of this specication is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect reliability.
1.8V DC Characteristics (Over Operating Range: VDD = 1.8V ± 0.15V, TA = -40° to 85°C)
Parameters
Description
Test Conditions(1)
Min.
Typ. (2)
Max.
Units
VDD
Supply Voltage
1.65
1.8
1.95
VIH
Input HIGH Voltage
Logic HIGH level
1.1
2.7
V
VIL
Input LOW Voltage
Logic LOW level
-0.3
0.35*VDD
II
Input Current(3)
VDD = Max,
Vin = VDD or GND
15
μA
VOH
Output High Voltage
VDD = Min., VIN = VIH or VIL
IOH = -2mA
1.35
V
IOH = -8mA
1.2
VOL
Output LOW Voltage
VDD = Min., VIN - VIH or VIL
IOL = 2mA
0.1
IOL = -8mA
0.2
Notes:
1. For Max. or Min. conditions, use appropriate operating VDD and Ta values.
2. Typical values are at VDD = 1.8V, +25°C ambient and maximum loading.
3.
This parameter is determined by device characterization but is not production tested.
09-0084
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