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参数资料
| 型号： | NCP1081DEG |
| 厂商： | ON Semiconductor |
| 文件页数： | 6/18页 |
| 文件大小： | 257K |
| 描述： | IC CONV CTLR POE-PD 40W 20-TSSOP |
| 标准包装： | 74 |
| 类型： | 以太网供电开关（PoE） |
| 应用： | 远程外设（工业控制，相机，数据访问） |
| 内部开关： | 是 |
| 电流限制： | 1.1A |
| 电源电压： | 0 V ~ 57 V |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 20-TSSOP（0.173"，4.40mm 宽）裸露焊盘 |
| 供应商设备封装： | 20-TSSOP-EP |
| 包装： | 管件 |
NCP1081
http://onsemi.com
6
Table 2. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Min.
Max.
Units
Conditions
VPORTP
Input power supply
0.3
72
V
Voltage with respect to VPORTN
1,2
RTN
ARTN
Analog ground supply 2
0.3
72
V
Passswitch in offstate
(Voltage with respect to VPORTN
1,2
)
VDDH
Internal regulator output
0.3
17
V
Voltage with respect to ARTN
VDDL
Internal regulator output
0.3
3.6
V
Voltage with respect to ARTN
CLASS
Analog output
0.3
3.6
V
Voltage with respect to VPORTN
1,2
INRUSH
Analog output
0.3
3.6
V
Voltage with respect to VPORTN
1,2
ILIM1
Analog output
0.3
3.6
V
Voltage with respect to VPORTN
1,2
UVLO
Analog input
0.3
3.6
V
Voltage with respect to VPORTN
1,2
OSC
Analog output
0.3
3.6
V
Voltage with respect to ARTN
COMP
Analog input / output
0.3
3.6
V
Voltage with respect to ARTN
FB
Analog input
0.3
3.6
V
Voltage with respect to ARTN
CS
Analog input
0.3
3.6
V
Voltage with respect to ARTN
SS
Analog input
0.3
3.6
V
Voltage with respect to ARTN
nCLASS_AT
Analog output
0.3
3.6
V
Voltage with respect to ARTN
TEST1
TEST2
Digital inputs
0.3
3.6
V
Voltage with respect to VPORTN
1,2
Ta
Ambient temperature
40
85
癈
Tj
Junction temperature
150
癈
TjTSD
Junction temperature (Note 1)
175
癈
Thermal shutdown condition
T
stg
Storage Temperature
55
150
癈
T
?/DIV>
JA
Thermal Resistance,
Junction to Air (Note 2)
37.6
癈/W
Exposed pad connected to VPORTN
1,2
ground
ESDHBM
Human Body Model
4
kV
per JEDEC Standard JESD22
ESDCDM
Charged Device Model
750
V
ESDMM
Machine Model
300
V
LU
Latchup
?00
mA
per JEDEC Standard JESD78
ESDSYS
System ESD (contact/air) (Note 3)
8/15
kV
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. TjTSD allowed during error conditions only. It is assumed that this maximum temperature condition does not occur more than 1 hour
cumulative during the useful life for reliability reasons.
2. Mounted on a 1S2P (3 layer) test board with copper coverage of 25 percent for the signal layers and 90 percent copper coverage for the
inner planes at an ambient temperature of 85癈 in still air. Refer to JEDEC JESD517 for details.
3. Surges per EN6100042, 1999 applied between RJ45 and output ground and between adapter input and output ground of the evaluation
board. The specified values are the test levels and not the failure levels.
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