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| 型号： | NCT75DR2G |
| 厂商： | ON Semiconductor |
| 文件页数： | 3/15页 |
| 文件大小： | 181K |
| 描述： | IC SENSOR TEMP DGTL 8SOIC |
| 标准包装： | 1 |
| 功能： | 温度监控系统（传感器） |
| 传感器类型： | 内部 |
| 感应温度： | -55°C ~ 125°C |
| 精确度： | ±3°C |
| 拓扑： | ADC（三角积分型），控制逻辑，寄存器库 |
| 输出类型： | 2 线串行，I²C?/SMBUS? |
| 输出警报： | 是 |
| 输出风扇： | 无 |
| 电源电压： | 3 V ~ 5.5 V |
| 工作温度： | -55°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 8-SOIC（0.154"，3.90mm 宽） |
| 供应商设备封装： | 8-SOICN |
| 包装： | 标准包装 |
| 其它名称： | NCT75DR2GOSDKR |
NCT75
http://onsemi.com
3
Table 2. ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Supply Voltage
V
DD
0.3 to +7
V
Input Voltage on SCL, SDA, A2, A1, A0 and OS
/ALERT
.
0.3 to V
DD
+ 0.3
V
Input Current on SDA, A2, A1, A0 and OS
/ALERT
.
I
IN
1 to +50
mA
Maximum Junction Temperature
T
J(max)
150.7
癈
Operating Temperature Range
T
OP
55 to 125
癈
Storage Temperature Range
T
STG
65 to 160
癈
ESD Capability, Human Body Model (Note 1)
ESD
HBM
2,000
V
ESD Capability, Machine Model (Note 1)
ESD
MM
400
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AECQ100002 (EIA/JESD22A114)
ESD Machine Model tested per AECQ100003 (EIA/JESD22A115)
Table 3. OPERATING RANGES
Rating
Symbol
Min
Max
Unit
Operating Supply Voltage
V
IN
3.0
5.5
V
Operating Ambient Temperature Range
T
A
55
125
癈
Table 4. SMBus TIMING SPECIFICATIONS
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Serial Clock Frequency
f
SCL
DC
400
kHz
Start Condition Hold Time
t
HD:STA
0.6
ms
Stop Condition Setup Time
t
SU:STO
90% of SCL to 10% of SDA
100
ns
Clock Low Period
t
LOW
1.3
ms
Clock High Period
t
HIGH
0.6
ms
Start Condition Setup Time
t
SU:STA
90% of SCL to 90% of SDA
100
ns
Data Setup Time
t
SU:DAT
10% of SDA to 10% of SCL
100
ns
Data Hold Time (Note 2)
t
HD:DAT
10% of SCL to 10% of SDA
0
76
ns
SDA/SCL Rise Time
t
R
300
ns
SDA/SCL Fall Time
t
F
300
ns
Minimum RESET Pulse Width
t
RESET
1.3
ms
Bus Free Time Between STOP
and START Conditions
t
BUF
1.3
ms
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
2. This refers to the hold time when the NCT75 is writing data to the bus.
SCL
SDA
STOP START
STOP
START
Figure 3. Serial Interface Timing
t
BUF
t
SU;STA
t
HD;STA
t
SU;STO
t
SU;DAT
t
HD;DAT
t
HD;STA
t
F
t
R
t
HIGH
t
LOW
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