参数资料
型号: NUP2105LT1
厂商: ON Semiconductor
文件页数: 5/7页
文件大小: 0K
描述: IC BUS PROTECTOR CAN 27V SOT-23
产品变化通告: Possible Adhesion Issue 11/July/2008
Wire Change 08/Jun/2009
Product Obsolescence 19/Jun/2009
标准包装: 3,000
电压 - 反向隔离(标准值): 24V
电压 - 击穿: 26.2V
功率(瓦特): 350W
电极标记: 2 通道阵列 - 双向
安装类型: 表面贴装
封装/外壳: TO-236-3,SC-59,SOT-23-3
供应商设备封装: SOT-23-3(TO-236)
包装: 带卷 (TR)
NUP2105L, SZNUP2105L
EMI Specifications
The EMI protection level provided by the TVS device can
be measured using the International Organization for
Standardization (ISO) 7637 ? 1 and ? 3 specifications that are
representative of various noise sources. The ISO 7637 ? 1
specification is used to define the susceptibility to coupled
transient noise on a 12 V power supply, while ISO 7637 ? 3
defines the noise immunity tests for data lines. The ISO 7637
tests also verify the robustness and reliability of a design by
applying the surge voltage for extended durations.
The IEC 61000 ? 4 ? X specifications can also be used to
quantify the EMI immunity level of a CAN system. The IEC
Table 2. ISO 7637 and IEC 61000 ? 4 ? X Test Specifications
61000 ? 4 and ISO 7637 tests are similar; however, the IEC
standard was created as a generic test for any electronic
system, while the ISO 7637 standard was designed for
vehicular applications. The IEC61000 ? 4 ? 4 Electrical Fast
Transient (EFT) specification is similar to the ISO 7637 ? 1
pulse 1 and 2 tests and is a requirement of SDS CAN
systems. The IEC 61000 ? 4 ? 5 test is used to define the power
absorption capacity of a TVS device and long duration
voltage transients such as lightning. Table 2 provides a
summary of the ISO 7637 and IEC 61000 ? 4 ? X test
specifications. Table 3 provides the NUP2105L’s ESD
test results.
Test
ISO 7637 ? 1
12 V Power Supply Lines
ISO 7637 ? 3
Data Line EFT
Waveform
Pulse 1
Pulse 2
Pulse ‘a’
Pulse ‘b’
Test Specifications
V s = 0 to ? 100 V
I max = 10 A
t duration = 5000 pulses
V s = 0 to +100 V
I max = 10 A
t duration = 5000 pulses
V s = ? 60 V
I max = 1.2 A
t duration = 10 minutes
V s = +40 V
I max = 0.8 A
NUP2105L Test
I max = 1.75 A
V clamp _ max = 31 V
t duration = 5000 pulses
R i = 10 W , t r = 1.0 m s,
t d_10% = 2000 m s, t 1 = 2.5 s,
t 2 = 200 ms, t 3 = 100 m s
I max = 9.5 A
V clamp _ max = 33 V
t duration = 5000 pulses
Ri = 10 W , t r = 1.0 m s,
t d_10% = 50 m s, t 1 = 2.5 s,
t 2 = 200 ms
I max = 50 A
V clamp _ max = 40 V
t duration = 60 minutes
R i = 50 W , t r = 5.0 ns,
t d_10% = 0.1 ms, t 1 = 100 m s,
t 2 = 10 ms, t 3 = 90 ms
Simulated Noise Source
DUT in parallel with
inductive load that is
disconnected from power
supply.
DUT in series with inductor
that is disconnected.
Switching noise of inductive
loads.
t duration = 10 minutes
IEC 61000 ? 4 ? 4
Data Line EFT
IEC 61000 ? 4 ? 5
V open circuit = 2.0 kV
I short circuit = 40 A
(Level 4 = Severe Industrial
Environment)
R i = 50 W , t r < 5.0 ns,
t d_50% = 50 ns, t burst = 15 ms,
f burst = 2.0 to 5.0 kHz,
t repeat = 300 ms
t duration = 1 minute
V open circuit = 1.2 x 50 m s,
I short circuit = 8 x 20 m s
R i = 50 W
(Note 2)
Switching noise of inductive
loads.
Lightning, nonrepetitive
power line and load
switching
1. DUT = device under test.
2. The EFT immunity level was measured with test limits beyond the IEC 61000 ? 4 ? 4 test, but with the more severe test conditions of
ISO 7637 ? 3.
Table 3. NUP2105L ESD Te st Results
ESD Specification
Human Body Model
IEC 61000 ? 4 ? 2
Test
Contact
Contact
Non ? contact (Air Discharge)
Test Level
16 kV
30 kV (Note 3)
30 kV (Note 3)
Pass
Pass
Pass
Pass / Fail
3. Test equipment maximum test voltage is 30 kV.
http://onsemi.com
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