参数资料
型号: OP604ESA-XN
厂商: Optek Technology
英文描述: High Reliability NPN Silicon Phototransistor
中文描述: 高可靠性NPN硅光电晶体管
文件页数: 1/2页
文件大小: 174K
代理商: OP604ESA-XN
Fea ures
Processed to Optek’s Space level
screening program patterned after
FSA/SCC Generic Specification 5000
Miniature hermetically sealed package
Ideal for direct mounting in PC boards
Mechanically and spectrally matched
to the OP224 Series LED
Description
The OP604ESA consists of a high
reliability NPN silicon phototransistor
mounted in a miniature glass lensed,
hermetically sealed, “pill” package.
All devices are processed to Optek’s
program patterned after ESA/SCC
Generic Specification No. 5000. See
page 13-4 for details. This device type is
lensed and has an acceptance half angle
of 18
o
measured from the optical axis to
the half power point. The series is also
mechanically and spectrally matched to
Optek’s OP224 series high reliability
infrared emitting diode.
Ab so ute Maxi mum Rat ngs
(T
A
= 25
o
C un ess oth er wise noted)
Stor age Tem pera ure Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65
o
C to +150
o
C
Op er at ng Tem pera ure Range. . . . . . . . . . . . . . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Collector- Emitter Volt age . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 V
Emitter- Collector Volt age. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.0 V
Sol der ng Tem pera ure (for 5 sec onds with sol der ng iron) . . . . . . . . . . . . . 240
C
Power Dis si pa ion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mW
(2)
Notes:
(1) No-clean or low solids RMA flux is recommended. Duration can be extended to 10 seconds
maximum when wave soldering.
(2) Derate linearly 0.5 mW/
o
C above 25
o
C.
(3) “X” defines the testing level per ESA/SCC Generic Specification 5000, Chart III. “X” will be
either “B” (full processing) or “C” (reduced processing).
“N” defines lot acceptance testing. “N” will be either 1, 2, or 3. Level 3 is the lowest defined
level with emphasis on electrical tests, solderability, and visual inspection. Level 2 requires
all tests of Level 3 and adds indurance testing (burn-in) with drift limits on key parameters.
Level 1 is the most stringent LAT level and includes all requirements of Levels 2 and 3 plus
additional testing for tolerance of thermal, mechanical, and environmental exposure.
Prod uct Bul e in OP604ESA
Sep em ber 1996
High Re i abil ty NPN Sili con Pho o ran sis or
Type OP604ESA- XN
(3)
Op ek Tech nol ogy, Inc. 1215 W. Crosby Road Car oll on, Texas 75006 (972) 323- 2200 Fax (972) 323- 2396
13-32
Part Num ber Guide
OP604ESA- XN
Op ek
High Re i abil ty
ESA/SCC Speci i ca ion
No. 5000
“B” - Full Proc ess ng
“C” - Re duced Proc ess ng
Level ”1”
En vi on men al/Me chani cal
plus 2 & 3
Level “2” Life Test ng plus
Level 3
Level “3" Elec ri cal
In spec ion
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