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参数资料
| 型号： | PC33888APNB |
| 厂商： | Motorola, Inc. |
| 元件分类： | 圆形连接器 |
| 英文描述： | Circular Connector; No. of Contacts:128; Series:MS27656; Body Material:Aluminum; Connecting Termination:Crimp; Connector Shell Size:25; Circular Contact Gender:Socket; Circular Shell Style:Wall Mount Receptacle RoHS Compliant: No |
| 中文描述： | 四高边和八路低端汽车开关 |
| 文件页数： | 9/32页 |
| 文件大小： | 667K |
| 代理商： | PC33888APNB |
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MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
33888
9
MAXIMUM RATINGS
All voltages are with respect to ground unless otherwise noted.
Rating
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage
Steady State
V
PWR
-16 to 41
V
Input Terminal Voltage
(Note 1)
V
IN
-0.3 to 7.0
V
WAKE Input Terminal Clamp Current
I
WICI
2.5
mA
Continuous per Output Current
(Note 2)
Low-Sides 4, 6, 8, 10
Low-Sides 5, 7, 9, 11
I
OUTLS
500
800
mA
Continuous per Output Current
(Note 3)
High-Sides 0, 1
High-Sides 2, 3
I
OUTHS
10
5.0
A
Output Clamp Energy
High-Sides 0, 1
(Note 4)
High-Sides 2, 3
(Note 5)
Low-Sides
(Note 6)
E
HS
E
HS
E
LS
450
120
50
mJ
ESD Voltage
Human Body Model
(Note 7)
Machine Model
(Note 8)
V
ESD1
V
ESD2
±2000
±200
V
Notes
1.
Exceeding voltage limits on SCLK, SI,
CS
, WDIN,
RST
, IHS, FSI, or ILS terminals may cause a malfunction or permanent damage to the
device.
Continuous low-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient
temperature will require calculation of maximum output current using package thermal resistance.
Continuous high-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient
temperature will require calculation of maximum output current using package thermal resistance.
Active HS0 and HS1 clamp energy using the following conditions: single nonrepetitive pulse, V
PWR
= 16.0 V, L = 40 mH, T
J
= 150°C.
Active HS2 and HS3 clamp energy using the following conditions: single nonrepetitive pulse, V
PWR
= 16.0 V, L = 10 mH, T
J
= 150°C.
Active low-side clamp energy using the following conditions: single nonrepetitive pulse, 450 mA, T
J
= 150°C.
ESD1 testing is performed in accordance with the Human Body Model (C
ZAP
=100 pF, R
ZAP
= 1500
).
ESD2 testing is performed in accordance with the Machine Model (C
ZAP
= 200 pF, R
ZAP
= 0
).
2.
3.
4.
5.
6.
7.
8.
F
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
n
.
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