
PI3B3244
3.3V, Hot Insertion
8-Bit, 2-Port NanoSwitch
2
PS8149F
08/25/04
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Capacitance (TA = 25°C, f = 1 MHz)
Parameters(4)
Description
Test Conditions
Typ.
Units
CIN
Input Capacitance
VIN = 0V
3.0
pF
COFF
A/B Capacitance, Switch Off
VIN = 0V
8.0
pF
CON
A/B Capacitance, Switch On
VIN = 0V
16.0
pF
DC Electrical Characteristics (OvertheOperatingRange,TA=–40°Cto+85°C,VCC=3.3V±10%)
Parameters Description
Test Conditions(1)
Min.
Typ(2)
Max.
Units
VIH
Input HIGH Voltage
Guaranteed Logic HIGH Level
2.0
V
VIL
Input LOW Voltage
Guaranteed Logic LOW Level
–0.5
0.8
V
IIH
Input HIGH Current
VCC = Max., VIN = VCC
±1
A
IIL
Input LOW Current
VCC = Max., VIN = GND
±1
A
IOZH
High Impedance Output Current 0
≤ IN, YN ≤ VCC
±1
A
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
–1.2
V
RON
Switch On Resistance(3)
VCC = Min.,VIN = 0.0V, ION = 48mA or 64mA
5
8
VCC = Min.,VIN = 2.4V, ION = 15mA
10
17
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, TA = 25°C ambient and maximum loading.
3. Measured by the voltage drop between A and B pin at indicated current through the switch. ON resistance is determined by the
lower of the voltages on the two (A,B) pins.
4. This parameter is determined by device characterization but is not production tested.
Storage Temperature ................................................................... –65°C to +150°C
Ambient Temperature with Power Applied ..................................... –40°C to +85°C
Supply Voltage to Ground Potential ................................................. –0.5Vto+4.6V
DC Input Voltage .............................................................................. –0.5Vto+4.6V
DC Output Current ....................................................................................... 120mA
Power Dissipation ............................................................................................ 0.5W
Note:
Stresses greater than those listed under MAXIMUM RATINGS may cause permanent
damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)