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参数资料
| 型号： | PLC18V8Z35N |
| 厂商： | NXP SEMICONDUCTORS |
| 元件分类： | PLD |
| 英文描述： | Zero standby power CMOS versatile PAL devices |
| 中文描述： | OT PLD, 35 ns, PDIP20 |
| 封装： | 0.300 INCH, PLASTIC, SOT-146-1, DIP-20 |
| 文件页数： | 10/23页 |
| 文件大小： | 225K |
| 代理商： | PLC18V8Z35N |
Philips Semiconductors
Product specification
PLC18V8Z
Zero standby power
CMOS versatile PAL devices
1997 Aug 08
10
AC ELECTRICAL CHARACTERISTICS
4
Commercial = 0
°
C
≤
T
amb
≤
+75
°
C, 4.75V
≤
V
CC
< 5.25V;
Industrial = –40
°
C
≤
T
amb
≤
+85
°
C, 4.5V
≤
V
CC
≤
5.5V; R
2
= 390
TEST CONDITION
1
PLC18V8Z25
(Commercial)
PLC18V8ZIA
(Industrial)
SYMBOL
PARAMETER
FROM
TO
R
1
(
)
C
L
(pF)
MIN
MAX
MIN
MAX
UNIT
Pulse width
t
CKP
Clock period
(Minimum t
IS
+ t
CKO
)
CLK +
CLK +
200
50
33
33
ns
t
CKH
Clock width High
CLK +
CLK –
200
50
15
15
ns
t
CKL
Clock width Low
CLK –
CLK +
200
50
15
15
ns
t
ARW
Async reset pulse width
I
±
, F
±
I +, F +
25
25
ns
Hold time
t
IH
Input or feedback
data hold time
CLK +
Input
±
200
50
0
0
ns
Setup time
t
IS
Input or feedback
data setup time
I
±
, F
±
CLK +
200
50
18
18
ns
Propagation delay
t
PD
Delay from input
to active output
I
±
, F
±
F
±
200
50
25
25
ns
t
CKO
Clock High to output valid
access Time
CLK +
F
±
200
50
15
15
ns
t
OE13
Product term enable to
outputs off
I
±
, F
±
F
±
Active-High R = 1.5k
Active-Low R = 550
50
25
25
ns
t
OD12
Product term disable to
outputs off
I
±
, F
±
F
±
From V
OH
R =
∞
From V
OL
R = 200
From V
OH
R =
∞
From V
OL
R = 200
5
25
25
ns
t
OD22
Pin 11 output disable High
to outputs off
OE –
F
±
5
20
20
ns
t
OE23
Pin 11 output enable to
active output
OE +
F
±
Active-High R = 1.5k
Active-Low R = 550
50
20
20
ns
t
ARD
Async reset delay
I
±
, F
±
F +
30
30
ns
t
ARR
Async reset recovery time
I
±
, F
±
CLK +
20
20
ns
t
SPR
Sync preset recovery time
I
±
, F
±
CLK +
20
20
ns
t
PPR
Power-up reset
V
CC
+
F +
25
25
ns
Frequency of operation
f
MAX
NOTES:
1. Refer also to AC Test Conditions. (Test Load Circuit)
2. For 3-State output; output enable times are tested with C
= 50pF to the 1.5V level, and S
is open for high-impedance to High tests and
closed for high-impedance to Low tests. Output disable times are tested with C
= 5pF. High-to-High impedance tests are made to an output
voltage of V
= (V
– 0.5V) with S
open, and Low-to-High impedance tests are made to the V
= (V
+ 0.5V) level with S
closed.
3. Resistor values of 1.5k and 550
provide 3-State levels of 1.0V and 2.0V, respectively. Output timing measurements are to 1.5V level.
4. Leave all the cells on unused product terms intact (unprogrammed) for all patterns.
Maximum frequency
I/(t
IS
+ t
CKO
)
200
50
30
30
MHz
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