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参数资料
| 型号： | PM13666S-1R0M-RC |
| 厂商： | Bourns Inc. |
| 文件页数： | 2/3页 |
| 文件大小： | 0K |
| 描述： | INDUCTOR SHIELDED PWR 1.0UH SMD |
| 产品培训模块： | Magnetic Product Overview |
| 标准包装： | 1 |
| 系列： | PM13666S |
| 电感： | 1µH |
| 电流： | 29A |
| 电流 - 饱和： | 50A |
| 类型： | 铁芯体 |
| 容差： | ±20% |
| 屏蔽： | 屏蔽 |
| DC 电阻(DCR)： | 最大 2.5 毫欧 |
| 材料 - 芯体： | 铁 |
| 封装/外壳： | 0.547" L x 0.531" W x 0.232" H（13.90mm x 13.50mm x 5.90mm） |
| 安装类型： | 表面贴装 |
| 包装： | 标准包装 |
| 工作温度： | -55°C ~ 150°C |
| 频率 - 测试： | 100kHz |
| 其它名称： | M8499DKR |
PM12645S, PM12651S, PM13560S, PM13656S, PM13666S Series -
Shielded Power Inductors
L vs. I Charts
1.6
PM12645S-1R2M-RC
160
2.4
PM12645S-1R8M-RC
160
4.0
PM12645S-2R7M-RC
140
1.2
0.8
0.4
0
120
80
40
0
2.0
1.5
1.2
0.8
0.4
0
120
80
40
0
3.2
2.4
1.6
0.8
0
120
100
80
60
40
20
0
0
10
20
30
40
50
0
8
16
24
32
40
0
8
16
24
32
DC Current (A)
DC Current (A)
DC Current (A)
0.60
0.54
0.48
0.42
0.36
0.30
0.24
0.18
0.12
0.06
0
0
5
PM12651S-R50M-RC
10 15 20 25 30 40 45
DC Current (A)
50
55
110
99
88
77
66
55
44
33
22
11
0
60
6.0
5.5
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
0
4
PM12651S-4R7M-RC
8 12 15 20
DC Current (A)
24
108
96
84
72
60
48
36
24
12
0
28
16
12
8
4
0
0
3
PM12651S-9R0M-RC
6 9 12
DC Current (A)
15
120
100
80
60
40
20
0
18
10
PM13560S-6R0M-RC
100
12.0
PM13560S-100M-RC
100
11.0
90
8
6
4
2
0
80
60
40
20
0
10.0
9.0
8.0
7.0
6.0
5.0
4.0
3.0
2.0
1.0
0
80
70
60
50
40
30
20
10
0
0
2.8
5.6
8.4
11.2
14
0
2
4
6
8
10
12
14
16
DC Current (A)
DC Current (A)
0.4
PM13656S-R22M-RC
100
0.60
PM13656S-R50M-RC
110
0.54
99
0.32
0.24
0.16
0.08
80
60
40
20
0.48
0.42
0.36
0.30
0.24
0.18
0.12
88
77
66
55
44
33
22
0
0
12
24
36
48
60
0
0.06
0
0
5
10
15
20
25
30
40
45
50
55
11
0
60
DC Current (A)
DC Current (A)
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
PM13666S-1R0M-RC
110
99
88
77
66
55
44
33
22
11
0
0
5
10
15
20
25
35
40
45
50
60
DC Current (A)
Speci?cations are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their speci?c applications.
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