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参数资料
| 型号： | PT7C5005ALD-1DE |
| 厂商： | PERICOM SEMICONDUCTOR CORP |
| 元件分类： | XO, clock |
| 英文描述： | OTHER CLOCK GENERATOR, UUC6 |
| 封装： | DIE-6 |
| 文件页数： | 6/10页 |
| 文件大小： | 355K |
| 代理商： | PT7C5005ALD-1DE |
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PT0254(05/07)
5
Ver:0
Data Sheet
PT7C5005AL series
Crystal Oscillator
DC Electrical Characteristics
PT7C5005ALx (VDD = 2.7 to 3.6V, TA = -20 to 80°C, unless otherwise noted.)
Rating
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
VOH
HIGH-level
output voltage
Q: Measurement cct 1, VDD= 2.7V, IOH= 8mA
2.2
2.4
-
V
VOL
LOW-level
output voltage
Q: Measurement cct 2, VDD= 2.7V, IOL= 8mA
-
0.3
0.4
V
VIH
HIGH-level
input voltage
INH
0.7VDD
-
V
VIL
LOW-level input
voltage
INH
-
0.3VDD
V
VOH= VDD
-
10
A
IZ
Output leakage
current
Q: Measurement
cct 2, INH =
LOW, VDD= 3.6V
VOL= GND
-
10
A
CL=30pF
-
40
100
mA
IDD
Current
consumption
Measurement cct
3, load cct 1,
VDD= 3.0 to 3.6V,
f=125MHz
CL=15pF
-
25
60
mA
IST
Standby current
Measurement cct 3, INH = LOW
-
10
A
RUP1
Measurement cct 4, INH=LOW
0.4
-
4
M
RUP2
INHN pull-up
resistance
Measurement cct 4, INH=0.7VDD
50
-
150
k
PT7C5005ALA
1.76
2.2
2.64
PT7C5005ALB
2.64
3.3
3.96
PT7C5005ALC
2.64
3.3
3.96
PT7C5005ALD
2.80
3.5
4.20
Rf1
AC
feedback
resistance
Design value. A
monitor pattern
on a wafer is
tested.
PT7C5005ALE
4.48
5.6
6.72
k
Rf2
DC feedback
resistance
Measurement cct 5
50
-
150
k
Cf
AC
feedback
capacitance
Design value. A monitor pattern on a wafer is
tested.
9.3
10
10.7
pF
PT7C5005ALA
PT7C5005ALD
PT7C5005ALE
7.44
8
8.56
PT7C5005ALB
5.58
6
6.42
CG
PT7C5005ALC
2.79
3
3.21
PT7C5005ALA
PT7C5005ALD
9.3
10
10.7
PT7C5005ALB
5.58
6
6.42
PT7C5005ALC
2.79
3
3.21
CD
Built-in
capacitance
Design value,
determined by the
internal wafer pattern
PT7C5005ALE
13.95
15
16.05
pF
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