参数资料
型号: PT7C5009AK1-2DEE
厂商: PERICOM SEMICONDUCTOR CORP
元件分类: XO, clock
英文描述: 40 MHz, OTHER CLOCK GENERATOR, UUC
封装: LEAD FREE, DIE
文件页数: 12/17页
文件大小: 430K
代理商: PT7C5009AK1-2DEE
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PT0194(05/06)
4
Ver:5
Data Sheet
PT7C5009 series
Crystal Oscillator Module ICs
Maximum Ratings
Storage Temperature (die form).....................................................- 65oC to +150oC
Storage Temperature (package form) ........................................- 55oC to +125oC
Ambient Temperature with Power Applied..............................................- 40oC to +85oC
Supply Voltage to Ground Potential (VDD to GND ..................- 0.5V to7.0V
DC Input (All Other Inputs except VDD & GND) . -0.5V to VDD +0.5V
DC Output Current (all outputs) ................................................. 25mA
Power Dissipation......................................................................500mW (package form)
Recommended Operating Conditions
Sym
Parameter
Series
Condition
Min
Typ
Max
Unit
f
≤ 16MHz
2.7
-
3.3
AH series
f
≤ 30MHz
AK series
f
≤ 40MHz
4.5
-
5.5
AN series
f
≤ 40MHz
CN series
f
≤ 30MHz
2.7
-
5.5
f
≤ 20MHz
2.25
-
2.75
f
≤ 30MHz
2.3
-
2.7
Die form
f
≤ 40MHz
f
≤ 40MHz
2.7
-
5.5
VDD
Supply voltage
AL series
Package
form
f
≤ 14.4MHz
2.4
-
2.7
V
VIN
Input voltage
All series
GND
-
VDD
V
f
≤ 16MHz, 2.7V ≤ V
DD ≤ 3.6V
-20
-
80
AH series
f
≤ 30MHz, 4.5V ≤ V
DD ≤ 5.5V
f
≤ 30MHz
-40
-
85
AK series
30MHz < f
≤ 40MHz
-20
-
80
f
≤ 40MHz, 2.7V ≤V
DD < 4.5V
-20
-
80
Die form
f
≤ 40MHz, 4.5V ≤V
DD ≤5.5V
-40
-
85
f
≤ 40MHz, 2.7V ≤V
DD < 5.5V
-20
-
80
AN series
Package
form
f
≤ 30MHz, 4.5V ≤V
DD ≤5.5V
-40
-
85
f
≤30MHz, 2.7V ≤V
DD < 4.5V
-10
-
70
CN series
f
≤30MHz, 4.5V ≤V
DD ≤5.5V
-40
-
85
f
≤ 40MHz, 2.7V ≤ V
DD ≤5.5V
-40
-
85
f
≤ 30MHz, 2.3V ≤ V
DD ≤2.7V
-20
-
80
Die form
f
≤ 20MHz, 2.25V ≤ V
DD ≤2.75V
-20
-
80
f
≤ 40MHz, 2.7V ≤ V
DD ≤5.5V
-20
-
80
f
≤ 30MHz, 2.7V ≤ V
DD ≤5.5V
-40
-
85
TOPR
Operating
temperature
AL series
Package
form
f
≤ 14.4MHz, 2.4V ≤ V
DD ≤2.7V
-20
-
80
°C
Note:
Stresses
greater
than
those
listed
under
MAXIMUM RATINGS may cause permanent
damage to the device. This is a stress rating only
and functional operation of the device at these or
any other condi-tions above those indicated in
the operational sec-tions of this specification is
not implied. Exposure to absolute maximum
rating conditions for extended periods may
affect reliability.
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