参数资料
型号: SAH-XC2299H-200F80L
厂商: INFINEON TECHNOLOGIES AG
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP176
封装: 0.50 MM PITCH, GREEN, PLASTIC, LQFP-176
文件页数: 17/159页
文件大小: 1756K
代理商: SAH-XC2299H-200F80L
XC2298H, XC2299H
XC2000 Family / High Line
Electrical Parameters
Data Sheet
113
V1.3, 2011-07
Broken wire detection
delay against VAGND
1)
t
BWG CC
50
2)
Broken wire detection
delay against VAREF
t
BWR CC
50
3)
Conversion time for 8-bit
t
c8 CC
(11 +
STC) x
t
ADCI +
2 x
t
SYS
Conversion time for 10-bit
t
c10 CC
(13 +
STC) x
t
ADCI +
2 x
t
SYS
Total Unadjusted Error
|TUE|
CC
12
LSB
4)
Wakeup time from analog
powerdown, fast mode
t
WAF CC
4
μs
Wakeup time from analog
powerdown, slow mode
t
WAS CC
15
μs
Analog reference ground
V
AGND
SR
V
SS -
0.05
1.5
V
Analog input voltage
range
V
AIN SR
V
AGND
V
AREF
V
5)
Analog reference voltage
V
AREF
SR
V
AGND
+ 1.0
V
DDPA
+ 0.05
V
1) This parameter includes the sample time (also the additional sample time specified by STC), the time to
determine the digital result and the time to load the result register with the conversion result. Values for the
basic clock
t
ADCI depend on programming.
2) The broken wire detection delay against
V
AGND is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 500
μs. Result below 10% (66
H)
3) The broken wire detection delay against
V
AREF is measured in numbers of consecutive precharge cycles at a
conversion rate of not more than 10
μs. This function is influenced by leakage current, in particular at high
temperature. Result above 80% (332
H)
Table 20
ADC Parameters (cont’d)
Parameter
Symbol
Values
Unit
Note /
Test Condition
Min.
Typ.
Max.
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