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| 型号： | SDA004-7 |
| 厂商： | Diodes Inc |
| 文件页数： | 2/5页 |
| 文件大小： | 0K |
| 描述： | DIODE SW 200MW 80V ESD SOT363 |
| 产品变化通告： | Wire Change 16/Sept/2008 |
| 产品目录绘图： | SOT-363 Circuit |
| 标准包装： | 1 |
| 电压 - 反向隔离（标准值）： | 80V |
| 电压 - 击穿： | 100V |
| 电极标记： | 2 通道阵列 - 双向 |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 6-TSSOP，SC-88，SOT-363 |
| 供应商设备封装： | SOT-363 |
| 包装： | 标准包装 |
| 产品目录页面： | 1599 (CN2011-ZH PDF) |
| 其它名称： | SDA004DIDKR |
SDA004
Maximum Ratings @T A = 25°C unless otherwise specified
Characteristic
Non-Repetitive Peak Reverse Voltage
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
Forward Continuous Current (Note 6)
Repetitive Peak Forward Current @ T p = 5 μ s, f = 50kHz (Note 6)
Non-Repetitive Peak Forward Surge Current @ t = 1.0 μ s
@ t = 1.0s
Clamping Voltage @ I pp = 20A (Note 7)
8x20 μ s Waveform
Symbol
V RM
V RRM
V RWM
V R
I FM
I FRM
I FSM
V C
Value
100
80
500
1000
20
1.0
16
Unit
V
V
mA
mA
A
V
Thermal Characteristics
Characteristic
Power Dissipation (Note 6)
Thermal Resistance, Junction to Ambient Air (Note 6)
Operating and Storage Temperature Range
Symbol
P D
R θ JA
T J , T STG
Value
200
625
-65 to +150
Unit
mW
° C/W
° C
Electrical Characteristics @T A = 25°C unless otherwise specified
Characteristic
Reverse Breakdown Voltage (Note 8)
Forward Voltage
Reverse Current (Note 8)
Symbol
V (BR)R
V F
I R
Min
80
0.62
?
?
?
?
Typ
?
?
?
Max
?
0.72
0.93
1.0
1.25
100
50
30
Unit
V
V
nA
μ A
μ A
Test Condition
I R = 100 μ A
I F = 5.0mA
I F = 20mA
I F = 100mA
I F = 150mA
V R = 70V
V R = 75V, T J = 150 ° C
V R = 25V, T J = 150 ° C
25
nA
V R = 20V
Capacitance, Between I/O Lines (I/O1 & I/O2)
Capacitance Between I/O Line and Ground
Reverse Recovery Time
C LL
C LG
t rr
?
?
?
2.5
3.3
?
4.0
5.3
4.0
pF
pF
ns
V R = 0V, f = 1.0MHz
V R = 0V, f = 1.0MHz
V R = 6V, I F = 5mA
Notes:
6. Device mounted on FR-4 PCB, 1 inch x 0.85 inch x 0.062 inch; pad layout as shown on Diodes Inc. suggested pad layout document AP02001, which
can be found on our website at http://www.diodes.com.
7. Referenced to V P or V N .
8. Short duration pulse test used to minimize self-heating effect.
SDA004
Document number: DS30452 Rev. 9 - 2
2 of 5
February 2011
? Diodes Incorporated
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