参数资料
型号: SFH9305
元件分类: 开关
英文描述: 3.28 mm SLOT WIDTH, 1 CHANNEL SLOTTED OPTICAL SWITCH TRANSISTOR OUTPUT
封装: ROHS COMPLIANT PACKAGE-4
文件页数: 5/7页
文件大小: 76K
代理商: SFH9305
MITSUBISHI <INTELLIGENT POWER MODULES>
PM100CS1D120
FLAT-BASE TYPE
INSULATED PACKAGE
May 2009
5
PRECAUTIONS FOR TESTING
1. Before applying any control supply voltage (VD), the input terminals should be pulled up by resistors, etc. to their corre-
sponding supply voltage and each input signal should be kept off state.
After this, the specified ON and OFF level setting for each input signal should be done.
2. When performing “SC” tests, the turn-off surge voltage spike at the corresponding protection operation should not be al-
lowed to rise above VCES rating of the device.
(These test should not be done by using a curve tracer or its equivalent.)
P, (U,V,W,B)
U,V,(N)
U,V,W,B, (N)
VD (all)
IN
Fo
IN
Fo
VD (all)
VCIN
(0V)
Ic
V
P, (U,V,W,B)
VCIN
(15V)
Ic
Fig. 7 Dead time measurement point example
Fig. 1 VCE(sat) Test
Fig. 2 VEC, (VFM) Test
0V
1.5V
2V
0V
t
tdead
1.5V: Input on threshold voltage Vth(on) typical value, 2V: Input off threshold voltage Vth(off) typical value
IPM’ input signal VCIN
(Upper Arm)
IPM’ input signal VCIN
(Lower Arm)
10%
90%
trr
Irr
tr
td(on)
tc(on)
tc(off)
td(off)
VCIN
Ic
VCE
10%
90%
tf
(ton = td(on) + tr)
(toff = td(off) + tf)
Fo
P
N
CS
U,V
Vcc
Ic
VD (all)
P
U,V
VCIN
(15V)
VCIN
(15V)
Fo
Fig. 3 Switching time and SC test circuit
Fig. 4 Switching time test waveform
a) Lower Arm Switching
Signal input
(Upper Arm)
Signal input
(Lower Arm)
Signal input
(Upper Arm)
Signal input
(Lower Arm)
b) Upper Arm Switching
VCIN
Fig. 5 ICES Test
Fig. 6 SC test waveform
SC Trip
Short Circuit Current
toff(SC)
VD (all)
U,V,W,B, (N)
P, (U,V,W,B)
A
Pulse
VCE
VCIN
(15V)
Ic
Fo
IN
Fo
Constant Current
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