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| 型号： | SN54ABT18502HVR |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |
| 封装： | CERAMIC, QFP-68 |
| 文件页数： | 1/30页 |
| 文件大小： | 451K |
| 代理商： | SN54ABT18502HVR |
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SN54ABT18502, SN74ABT18502
SCAN TEST DEVICES WITH
18-BIT REGISTERED BUS TRANSCEIVERS
SCBS109B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1993, Texas Instruments Incorporated
1
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
UBT (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis at Inputs With
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
Pack Using 0.5-mm Center-to-Center
Spacings and 68-Pin Ceramic Quad Flat
Pack Using 25-mil Center-to-Center
Spacings
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
NC
TMS
1CLKBA
1A2
1A1
1OEAB
GND
1LEAB
1CLKAB
TDO
NC
TCK
2CLKBA
2LEBA
2A9
GND
2OEAB
2LEAB
2CLKAB
TDI
2A7
2A8
1LEBA
1OEBA
GND
2OEBA
2B9
2B8
GND
1B1
1B2
1B3
SN54ABT18502 . . . HV PACKAGE
(TOP VIEW)
CC
V
CC
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
28 29 30 31 32 33 34
87
6
5
4
93
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
SCOPE, Widebus, UBT, and EPIC-IIB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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相关代理商/技术参数 |
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| SN54ABT18504 | 制造商:TI 制造商全称:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
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| SN54ABT18640 | 制造商:TI 制造商全称:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
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