
SN54AC14, SN74AC14
HEX SCHMITT-TRIGGER INVERTERS
SCAS522D – AUGUST 1995 – REVISED FEBRUARY 1998
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D EPIC (Enhanced-Performance Implanted
CMOS) Submicron Process
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), and Thin Shrink Small-Outline (PW)
Packages, Ceramic Chip Carriers (FK) and
Flatpacks (W), and Standard Plastic (N) and
Ceramic (J) DIPS
description
The ’AC14 devices contain six independent
inverters. The devices perform the Boolean
function Y = A.
The SN54AC14 is characterized for operation
over the full military temperature range of –55
°C
to 125
°C. The SN74AC14 is characterized for
operation from –40
°C to 85°C.
FUNCTION TABLE
(each inverter)
INPUT
OUTPUT
INPUT
A
OUTPUT
Y
H
L
H
logic symbol
1
1A
3
2A
5
3A
9
4A
11
5A
13
6A
1Y
2
3Y
6
2Y
4
4Y
8
6Y
12
5Y
10
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, DB, J, N, PW, or W packages.
logic diagram, each inverter (positive logic)
AY
Copyright
1998, Texas Instruments Incorporated
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1Y
2A
2Y
3A
3Y
GND
VCC
6A
6Y
5A
5Y
4A
4Y
32
1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
6Y
NC
5A
NC
5Y
2A
NC
2Y
NC
3A
SN54AC14 . . . FK PACKAGE
(TOP VIEW)
1Y
A1
NC
4Y
4A
V
6A
3Y
GND
NC
NC – No internal connection
CC
SN54AC14 ...J OR W PACKAGE
SN74AC14 . . . D, DB, N, OR PW PACKAGE
(TOP VIEW)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.