SN54AHC02, SN74AHC02
QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SCLS254H – DECEMBER 1995 – REVISED JANUARY 2000
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D EPIC (Enhanced-Performance Implanted
CMOS) Process
D Operating Range 2-V to 5.5-V VCC
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
description
The ’AHC02 devices contain four independent
2-input NOR gates that perform the Boolean
function Y = A
S B or Y = A + B in positive logic.
The SN54AHC02 is characterized for operation
over the full military temperature range of –55
°C
to 125
°C. The SN74AHC02 is characterized for
operation from –40
°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
Y
H
X
L
X
HL
L
H
Copyright
2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1Y
1A
1B
2Y
2A
2B
GND
VCC
4Y
4B
4A
3Y
3B
3A
SN54AHC02 ...J OR W PACKAGE
SN74AHC02 . . . D, DB, DGV, N, OR PW PACKAGE
(TOP VIEW)
32 1 20 19
910 11 12 13
4
5
6
7
8
18
17
16
15
14
4B
NC
4A
NC
3Y
1B
NC
2Y
NC
2A
1A
1Y
NC
3A
3B
V
4Y
2B
GND
NC
SN54AHC02 . . . FK PACKAGE
(TOP VIEW)
CC
NC – No internal connection
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.